Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure

被引:3
|
作者
Xu, Qi [1 ]
Geng, Hao [2 ]
Ni, Tianming [3 ]
Chen, Song [1 ]
Yu, Bei [2 ]
Kang, Yi [1 ]
Wen, Xiaoqing [4 ]
机构
[1] Univ Sci & Technol China, Sch Microelect, Hefei 230026, Peoples R China
[2] Chinese Univ Hong Kong, Dept Comp Sci & Engn, Hong Kong, Peoples R China
[3] Anhui Polytech Univ, Coll Elect Engn, Wuhu 241000, Peoples R China
[4] Kyushu Inst Technol, Dept Comp Sci & Networks, Fukuoka 8048550, Japan
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
Through-silicon vias; Circuit faults; Fault tolerant systems; Delays; Maintenance engineering; Redundancy; Registers; Fault tolerance; three-dimensional integrated circuit (3D-IC); through silicon via (TSV) repair; yield enhancement; 3-D ICS;
D O I
10.1109/TCAD.2021.3133484
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In three-dimensional integrated circuits (3D-ICs), through silicon via (TSV) is a critical technique in providing vertical connections. However, yield is one of the key obstacles to adopt the TSV-based 3D-ICs technology in the industry. Various fault-tolerance structures using redundant TSVs to repair faulty functional TSVs have been proposed in the literature for yield and reliability enhancement. However, the TSV repair paths under delay constraint cannot always be generated due to the lack of appropriate repair algorithms. In this article, we propose an effective TSV repair strategy for the router-based TSV redundancy architecture, taking into account the delay overhead. First, we prove that the router-based fault-tolerance structure configuration (RFSC) with the delay constraint is equivalent to the length-bounded multicommodity flow (LBMCF) problem. Then, an integer linear programming (ILP) formulation with acceptable scalability is presented to solve the LBMCF problem. The experimental results demonstrate that, compared with state-of-the-art fault-tolerance designs, the proposed ILP model can provide higher yield and lower delay overhead.
引用
收藏
页码:3182 / 3187
页数:6
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