Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure

被引:3
|
作者
Xu, Qi [1 ]
Geng, Hao [2 ]
Ni, Tianming [3 ]
Chen, Song [1 ]
Yu, Bei [2 ]
Kang, Yi [1 ]
Wen, Xiaoqing [4 ]
机构
[1] Univ Sci & Technol China, Sch Microelect, Hefei 230026, Peoples R China
[2] Chinese Univ Hong Kong, Dept Comp Sci & Engn, Hong Kong, Peoples R China
[3] Anhui Polytech Univ, Coll Elect Engn, Wuhu 241000, Peoples R China
[4] Kyushu Inst Technol, Dept Comp Sci & Networks, Fukuoka 8048550, Japan
基金
国家重点研发计划; 中国国家自然科学基金;
关键词
Through-silicon vias; Circuit faults; Fault tolerant systems; Delays; Maintenance engineering; Redundancy; Registers; Fault tolerance; three-dimensional integrated circuit (3D-IC); through silicon via (TSV) repair; yield enhancement; 3-D ICS;
D O I
10.1109/TCAD.2021.3133484
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In three-dimensional integrated circuits (3D-ICs), through silicon via (TSV) is a critical technique in providing vertical connections. However, yield is one of the key obstacles to adopt the TSV-based 3D-ICs technology in the industry. Various fault-tolerance structures using redundant TSVs to repair faulty functional TSVs have been proposed in the literature for yield and reliability enhancement. However, the TSV repair paths under delay constraint cannot always be generated due to the lack of appropriate repair algorithms. In this article, we propose an effective TSV repair strategy for the router-based TSV redundancy architecture, taking into account the delay overhead. First, we prove that the router-based fault-tolerance structure configuration (RFSC) with the delay constraint is equivalent to the length-bounded multicommodity flow (LBMCF) problem. Then, an integer linear programming (ILP) formulation with acceptable scalability is presented to solve the LBMCF problem. The experimental results demonstrate that, compared with state-of-the-art fault-tolerance designs, the proposed ILP model can provide higher yield and lower delay overhead.
引用
收藏
页码:3182 / 3187
页数:6
相关论文
共 50 条
  • [31] MEASUREMENT-BASED EVALUATION OF OPERATING SYSTEM FAULT-TOLERANCE
    LEE, I
    TANG, D
    IYER, RK
    HSUEH, MC
    IEEE TRANSACTIONS ON RELIABILITY, 1993, 42 (02) : 238 - 249
  • [32] Transparent Fault-Tolerance Based on Asynchronous Virtual Machine Replication
    Colesa, Adrian
    Stan, Ioan
    Ignat, Iosif
    12TH INTERNATIONAL SYMPOSIUM ON SYMBOLIC AND NUMERIC ALGORITHMS FOR SCIENTIFIC COMPUTING (SYNASC 2010), 2011, : 442 - 448
  • [33] Swarm intelligence: making differences in analogue circuits structure for fault-tolerance
    Chang, Huan
    He, Jingsong
    INTERNATIONAL JOURNAL OF COMPUTER APPLICATIONS IN TECHNOLOGY, 2013, 46 (03) : 210 - 219
  • [34] Increased Fault-Tolerance and Real-time Performance Resiliency for Stream Processing Workloads through Redundancy
    Tran, Geoffrey Phi C.
    Walters, John Paul
    Crago, Stephen P.
    2019 IEEE INTERNATIONAL CONFERENCE ON SERVICES COMPUTING (IEEE SCC 2019), 2019, : 51 - 55
  • [35] A New Fault-Tolerance Motor with Decoupled Reluctance Channel and PM Channel
    Chen, Qian
    Fan, Xun
    Liu, Guohai
    Zhao, Wenxiang
    Ji, Jinghua
    Xu, Liang
    Xu, Gaohong
    2017 IEEE 26TH INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS (ISIE), 2017, : 214 - 219
  • [36] Adaptive 3D-IC TSV Fault Tolerance Structure Generation
    Chen, Song
    Xu, Qi
    Yu, Bei
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2019, 38 (05) : 949 - 960
  • [37] Optimization of bias current coefficient in the fault-tolerance of active magnetic bearings based on the redundant structure parameters
    Cheng, Xin
    Deng, Shuai
    Cheng, Baixin
    Lu, Meiqian
    Zhou, Rougang
    AUTOMATIKA, 2020, 61 (04) : 602 - 613
  • [38] Fault-Tolerant Mesh-Based NoC with Router-Level Redundancy
    Yung-Chang Chang
    Cihun-Siyong Alex Gong
    Ching-Te Chiu
    Journal of Signal Processing Systems, 2020, 92 : 345 - 355
  • [39] Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation
    Ahmed, Soyed Tuhin
    Rakhmatullin, Roman
    Tahoori, Mehdi B.
    2023 IEEE EUROPEAN TEST SYMPOSIUM, ETS, 2023,
  • [40] PASSIVE FAULT-TOLERANCE MANAGEMENT IN COMPONENT-BASED EMBEDDED SYSTEMS
    Nogueira, Luis
    Coelho, Jorge
    COMPUTING AND INFORMATICS, 2015, 34 (01) : 23 - 44