Methods of Coherent X-Ray Diffraction Imaging

被引：12
作者：
Prosekov, P. A. [1 ]
Nosik, V. L. [1 ,3 ]
Blagov, A. E. [2 ]
机构：
[1] Russian Acad Sci, Fed Sci Res Ctr Crystallog & Photon, Shubnikov Inst Crystallog, Moscow 119333, Russia
[2] Kurchatov Inst, Natl Res Ctr, Moscow 123182, Russia
[3] Natl Res Nucl Univ MEPhI, Moscow Engn Phys Inst, Moscow 115409, Russia
来源：
CRYSTALLOGRAPHY REPORTS | 2021年 / 66卷 / 06期
基金：
俄罗斯基础研究基金会;
关键词：
FREE-ELECTRON LASER; SPECKLE VISIBILITY SPECTROSCOPY; PHOTON-CORRELATION SPECTROSCOPY; FOURIER PHASE PROBLEMS; ORIENTATIONAL ORDER; LOCAL-STRUCTURE; SCATTERING; RETRIEVAL; RESOLUTION; MICROSCOPY;
D O I：
10.1134/S1063774521060286
中图分类号：
O7 [晶体学];
学科分类号：
0702 ; 070205 ; 0703 ; 080501 ;
摘要：
Methods of coherent X-ray diffraction imaging of the spatial structure of noncrystalline objects and nanocrystals (nanostructures) are considered. Particular attention is paid to the methods of scanning-based coherent diffraction imaging (ptychography), visualization based on coherent surface scattering with application of correlation spectroscopy approaches, and specific features of visualization using X-ray free-electron laser radiation. The corresponding data in the literature are analyzed to demonstrate the state of the art of the methods of coherent diffraction imaging and fields of their application.
引用
收藏
页码：867 / 882
页数：16
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