Reading and writing charge on graphene devices

被引：7

作者：

Connolly, M. R. ^{[1
,2
]}

Herbschleb, E. D. ^{[1
]}

Puddy, R. K. ^{[1
]}

Roy, M. ^{[3
]}

Anderson, D. ^{[1
]}

Jones, G. A. C. ^{[1
]}

Maksym, P. ^{[3
]}

Smith, C. G. ^{[1
]}

机构：

[1] Univ Cambridge, Cavendish Lab, Dept Phys, Cambridge CB3 0HE, England

[2] Natl Phys Lab, Teddington TW11 0LW, Middx, England

[3] Univ Leicester, Dept Phys & Astron, Leicester LE1 7RH, Leics, England

来源：

APPLIED PHYSICS LETTERS | 2012年 / 101卷 / 02期

基金：

英国工程与自然科学研究理事会;

关键词：

SCANNED GATE MICROSCOPY; FORCE MICROSCOPY; TIP;

D O I：

10.1063/1.4732802

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We use a combination of charge writing and scanning gate microscopy to map and modify the local charge neutrality point of graphene field-effect devices. We give a demonstration of the technique by writing remote charge in a thin dielectric layer over a graphene-metal interface and detecting a shift in the local charge neutrality point. We perform electrostatic simulations to characterize the interaction between a realistic scanning probe tip, the deposited charge, and the graphene and find a good semi-quantitative agreement with the experimental results. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4732802]

引用

页数：4

共 25 条

[1] Classical Hall effect in scanning gate experiments [J].

Baumgartner, A. ;

Ihn, T. ;

Ensslin, K. ;

Papp, G. ;

Peeters, F. ;

Maranowski, K. ;

Gossard, A. C. .

PHYSICAL REVIEW B, 2006, 74 (16)

[2] Imaging coherent transport in graphene (part I): mapping universal conductance fluctuations [J].

Berezovsky, J. ;

Borunda, M. F. ;

Heller, E. J. ;

Westervelt, R. M. .

NANOTECHNOLOGY, 2010, 21 (27)

[3] Imaging coherent transport in graphene (part II): probing weak localization [J].

Berezovsky, Jesse ;

Westervelt, Robert M. .

NANOTECHNOLOGY, 2010, 21 (27)

[4] Biased bilayer graphene: Semiconductor with a gap tunable by the electric field effect [J].

Castro, Eduardo V. ;

Novoselov, K. S. ;

Morozov, S. V. ;

Peres, N. M. R. ;

Dos Santos, J. M. B. Lopes ;

Nilsson, Johan ;

Guinea, F. ;

Geim, A. K. ;

Castro Neto, A. H. .

PHYSICAL REVIEW LETTERS, 2007, 99 (21)

[5] The electronic properties of graphene [J].

Castro Neto, A. H. ;

Guinea, F. ;

Peres, N. M. R. ;

Novoselov, K. S. ;

Geim, A. K. .

REVIEWS OF MODERN PHYSICS, 2009, 81 (01) :109-162

[6] Scanning gate microscopy of current-annealed single layer graphene [J].

Connolly, M. R. ;

Chiou, K. L. ;

Smith, C. G. ;

Anderson, D. ;

Jones, G. A. C. ;

Lombardo, A. ;

Fasoli, A. ;

Ferrari, A. C. .

APPLIED PHYSICS LETTERS, 2010, 96 (11)

[7] Conductance quantization at a half-integer plateau in a symmetric GaAs quantum wire [J].

Crook, R. ;

Prance, J. ;

Thomas, K. J. ;

Chorley, S. J. ;

Farrer, I. ;

Ritchie, D. A. ;

Pepper, M. ;

Smith, C. G. .

SCIENCE, 2006, 312 (5778) :1359-1362

[8] Erasable electrostatic lithography for quantum components [J].

Crook, R ;

Graham, AC ;

Smith, CG ;

Farrer, I ;

Beere, HE ;

Ritchie, DA .

NATURE, 2003, 424 (6950) :751-754

[9] One-dimensional probability density observed using scanned gate microscopy [J].

Crook, R ;

Smith, CG ;

Simmons, MY ;

Ritchie, DA .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2000, 12 (50) :L735-L740

[10] SELF-CONSISTENT EFFECTIVE-MASS THEORY FOR INTRALAYER SCREENING IN GRAPHITE-INTERCALATION COMPOUNDS [J].

DIVINCENZO, DP ;

MELE, EJ .

PHYSICAL REVIEW B, 1984, 29 (04) :1685-1694

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