Common Mode Filter for USB 3 Interfaces

被引:0
作者
Werner, Jens [1 ]
Schuett, Jennifer [2 ]
Notermans, Guido [2 ]
机构
[1] Jade Univ Appl Sci Wilhelmshaven Oldenburg Elsfle, Friedrich Paffrath Str 101, D-26389 Wilhelmshaven, Germany
[2] NXP Semicond Germany GmbH, Stresemannallee 101, D-22529 Hamburg, Germany
来源
2016 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY (EMC) | 2016年
关键词
USB; 3.1; common mode filter; ESD protection; TLP; mobile phones; WIFI; Bluetooth; LTE; EMI; ESD PROTECTION; SCR;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an integrated common mode filter (CMF) for USB 3 interfaces that are operated in Super-Speed mode. For the protection of sensitive USB ports against Electrostatic Discharge (ESD) this filter device includes an advanced low-voltage triggered semiconductor controlled rectifier (LVTSCR). Compared to conventional ESD protection diodes, LVTSCR offer a very low junction capacitance (only 0.20 pF) and a low clamping voltage due to the low dynamic resistance (0.14 Ohm). The manufacturing process combines planar layers of copper and polyimide on top of bipolar silicon wafer. The integrated Cu-air coils obviate the need for additional ferrites for common mode suppression. The -3 dB passband frequency for the differential mode is 6 GHz, while the common mode exhibits a strong attenuation of frequencies above 1 GHz (> 15 dB). A distinctive notch characteristic for the common mode is visible between 2 GHz and 3 GHz (typ. > 30 dB). This makes the device suitable for applications where USB 3.1, Gen 1 and 2.4 GHz WIFI (802.11 b/g/n) are implemented in close vicinity. Due to the small size (0.8mm by 1.2 mm) the device is beneficial in portable applications like smartphones.
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页数:5
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