Carbon-based resistive memories

被引:0
|
作者
Koelmans, W. W. [1 ]
Bachmann, T. [2 ]
Zipoli, F. [1 ]
Ott, A. K. [3 ]
Dou, C. [3 ]
Ferrari, A. C. [3 ]
Cojocaru-Miredin, O. [4 ,5 ]
Zhang, S. [5 ]
Scheu, C. [5 ]
Wuttig, M. [4 ]
Nagareddy, V. K. [2 ]
Craciun, M. F. [2 ]
Alexeev, A. M. [2 ]
Wright, C. D. [2 ]
Jonnalagadda, V. P. [1 ]
Curioni, A. [1 ]
Sebastian, A. [1 ]
Eleftheriou, E. [1 ]
机构
[1] IBM Res Zurich, Saumerstr 4, CH-8803 Ruschlikon, Switzerland
[2] Univ Exeter, Coll Engn Math & Phys Sci, Exeter EX4 4QF, Devon, England
[3] Univ Cambridge, Cambridge Graphene Ctr, Cambridge CB3 0FA, England
[4] Rhein Westfal TH Aachen, Inst Phys IA, D-52056 Aachen, Germany
[5] Max Planck Inst Eisenforsch GmbH, Max Planck Str 1, D-40237 Dusseldorf, Germany
来源
2016 IEEE 8TH INTERNATIONAL MEMORY WORKSHOP (IMW) | 2016年
关键词
Nonvolatile memory; oxygenated carbon; RRAM; tetrahedral amorphous carbon; diamond-like carbon; storage class memory; TETRAHEDRAL AMORPHOUS-CARBON;
D O I
暂无
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Carbon-based nonvolatile resistive memories are an emerging technology. Switching endurance remains a challenge in carbon memories based on tetrahedral amorphous carbon (ta-C). One way to counter this is by oxygenation to increase the repeatability of reversible switching. Here, we overview the current status of carbon memories. We then present a comparative study of oxygen-free and oxygenated carbon-based memory devices, combining experiments and molecular dynamics (MD) simulations.
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页数:4
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