Thickness dependence of giant magnetoresistance of Co20Ag80 granular films

被引：0

作者：

Urbaniak, M ^{[1
]}

Goscianska, I ^{[1
]}

Ratajczak, H ^{[1
]}

机构：

[1] ADAM MICKIEWICZ UNIV POZNAN,INST PHYS,PL-60769 POZNAN,POLAND

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1997年 / 160卷 / 01期

关键词：

D O I：

10.1002/1521-396X(199703)160:1<121::AID-PSSA121>3.0.CO;2-T

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The thickness dependence of magnetoresistance was studied for a series of thin Co20Ag80 films. The room temperature magnetoresistance in perpendicular configuration (CIP) was measured for as-deposited and annealed samples in fields up to 2 T. All samples were annealed for 10 min at temperatures ranging from 423 to 623 K at steps of 100 K. MR values growing with the thickness t were observed. MR varies steeply for small t and saturates at larger thicknesses. Changes of the width of the MR curve with the film thickness were also analyzed.

引用

页码：121 / 125

页数：5

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