Advance validation of radiation hardness and reliability of lasers for CMS optical links

被引:1
作者
Macias, R [1 ]
Axer, M
Dris, S
Gill, K
Grabit, R
Noah, E
Troska, J
Vasey, F
机构
[1] CERN, PH Dept, CH-1211 Geneva, Switzerland
[2] Univ Autonoma Madrid, Dept Appl Phys, Madrid, Spain
[3] Univ London Imperial Coll Sci Technol & Med, Dept High Energy Phys, London, England
关键词
CMS optical links; lasers; radiation hardness assurance; reliability;
D O I
10.1109/TNS.2005.855812
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The production of laser transmitters for 60000 optical links is ongoing for the CMS Experiment at CERN. A series of advance validation tests (AVTs) that assure the radiation hardness and reliability has been performed on 390 edge-emitting 1310 nm lasers taken from 13 different starting wafers, before the laser die have been assembled into final transmitters. The AVT also offered a first opportunity to characterize, with good statistics, the effects of radiation damage, annealing and accelerated aging, using a large number of laser samples.
引用
收藏
页码:1488 / 1496
页数:9
相关论文
共 22 条
  • [1] [Anonymous], 1993, ESTIMATING DEVICE RE
  • [2] Barnes C. E., 1984, SAND840771
  • [3] BRICKHARD B, RADIO ISOTOPE TEST A
  • [4] CERVELLI G, 2001, P 7 WORKSH EL LHC EX
  • [5] *CMS, 1998, 986 CMS CERN LHCC
  • [6] Fukuda M., 1991, RELIABILITY DEGRADAT
  • [7] Radiation hardness qualification of InGaAsP/InP 1310-nm lasers for the CMS tracker optical links
    Gill, K
    Grabit, R
    Troska, J
    Vasey, F
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2002, 49 (06) : 2923 - 2929
  • [8] Gill K, 2001, CERN REPORT, V2001, P160
  • [9] Radiation damage and annealing in 1310nm InGaAsP/InP lasers for the CMS tracker
    Gill, K
    Cervelli, G
    Grabit, R
    Jensen, F
    Vasey, F
    [J]. PHOTONICS FOR SPACE ENVIRONMENTS VII, 2000, 4134 : 176 - 184
  • [10] Ageing tests of radiation damaged lasers and photodiodes for the CMS experiment at CERN
    Gill, K
    Azevedo, C
    Batten, J
    Cervelli, G
    Grabit, R
    Jensen, F
    Troska, J
    Vasey, F
    [J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2000, 47 (03) : 667 - 674