Embedded Multi-Die Interconnect Bridge (EMIB) - A High Density, High Bandwidth Packaging Interconnect

被引:221
作者
Mahajan, Ravi [1 ]
Sankman, Robert [1 ]
Patel, Neha [1 ]
Kim, Dae-Woo [1 ]
Aygun, Kemal [1 ]
Qian, Zhiguo [1 ]
Mekonnen, Yidnekachew [1 ]
Salama, Islam [1 ]
Sharan, Sujit [1 ]
Iyengar, Deepti [1 ]
Mallik, Debendra [1 ]
机构
[1] Intel Corp, Assembly Test Technol Dev, Chandler, AZ 85226 USA
来源
2016 IEEE 66TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC) | 2016年
关键词
dense MCP; high bandwidth packaging; heterogeneous integration;
D O I
10.1109/ECTC.2016.201
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The EMIB dense MCP technology is a new packaging paradigm that provides localized high density interconnects between two or more die on an organic package substrate, opening up new opportunities for heterogeneous on-package integration. This paper provides an overview of EMIB architecture and package capabilities. First, EMIB is compared with other approaches for high density interconnects. Some of the inherent advantages of the technology, such as the ability to cost effectively implement high density interconnects without requiring TSVs, and the ability to support the integration of many large die in an area much greater than the typical reticle size limit are highlighted. Next, the overall EMIB architecture envelope is discussed along with its constituent building blocks, the package construction with the embedded bridge, die to package interconnect features. Next, the EMIB assembly process is described at a high level. Finally, high bandwidth signaling between the die is discussed and the link bandwidth envelope is quantified.
引用
收藏
页码:557 / 565
页数:9
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