Chemical etching of a semiconductor surface assisted by single sheets of reduced graphene oxide

被引:24
作者
Hirano, Tomoki [1 ]
Nakade, Kazuki [1 ]
Li, Shaoxian [1 ]
Kawai, Kentaro [1 ]
Arima, Kenta [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, 2-1 Yamada Oka, Suita, Osaka 5650871, Japan
基金
日本学术振兴会;
关键词
EXFOLIATED GRAPHITE OXIDE; OXYGEN REDUCTION REACTION; NITROGEN-DOPED GRAPHENE; POROUS SILICON; CATALYST; GREEN; FILMS; WATER; SUSPENSIONS; HYDRAZINE;
D O I
10.1016/j.carbon.2017.11.053
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Catalyst-assisted chemical etching is an emerging technology for fabricating a variety of three-dimensional nanostructures on a semiconductor surface for future electronic and optical devices. In contrast to conventional wet etching using noble metals, we performed a fundamental study on the chemical etching of a Ge surface assisted by dispersed sheets of reduced graphene oxide (rGO) in water with dissolved O-2 molecules. We found that a monolayer sheet of rGO on Ge does not act as a mask but as a chemical tool that enhances etching under the entire sheet. This is probably caused by the dissociation of adsorbed O-2 molecules at the edges of vacancies in an rGO sheet, which leads to the formation of a soluble GeO2 layer. We also propose that the reagents and by-products involved in this etching diffuse along the interface between an rGO sheet and the wall of etched Ge, which we believe is a key for achieving higher etching rates. This study is expected to lead to a nanoscale manufacturing process for semiconductor surfaces free from noble-metal contamination. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:681 / 687
页数:7
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