共 50 条
- [1] Predicting IGBT junction temperature under transient condition ISIE 2002: PROCEEDINGS OF THE 2002 IEEE INTERNATIONAL SYMPOSIUM ON INDUSTRIAL ELECTRONICS, VOLS 1-4, 2002, : 874 - 877
- [2] A METHOD FOR PREDICTING IGBT JUNCTION TEMPERATURE UNDER TRANSIENT CONDITION IECON 2008: 34TH ANNUAL CONFERENCE OF THE IEEE INDUSTRIAL ELECTRONICS SOCIETY, VOLS 1-5, PROCEEDINGS, 2008, : 403 - 408
- [3] On temperature prediction of multiple-chip packages by a combined analysis-finite element method Warme- und Stoffubertragung Zeitschrift, 1995, 30 (03): : 197 - 204
- [4] ON TEMPERATURE PREDICTION OF MULTIPLE-CHIP PACKAGES BY A COMBINED ANALYSIS-FINITE ELEMENT METHOD HEAT AND MASS TRANSFER, 1995, 30 (03): : 197 - 204
- [7] Stress distribution of bonding wire of IGBT module under DC power cycling condition ICEPT2019: THE 2019 20TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY, 2019,
- [8] Multiple-chip module design optimizations using a novel layout parameterization technique 2003 IEEE RADIO FREQUENCY INTEGRATED CIRCUITS (RFIC) SYMPOSIUM, DIGEST OF PAPERS, 2003, : 587 - 590
- [9] Multiple-chip module design optimizations using a novel layout parameterization technique 2003 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, 2003, : A73 - A76
- [10] Junction Temperature Calculation of an IGBT Module in Simulation Platform 2018 IEEE INTERNATIONAL CONFERENCE ON POWER ELECTRONICS, DRIVES AND ENERGY SYSTEMS (PEDES), 2018,