Design, construction and performance of a TOF-SIMS for analysis of trace elements in geological materials

被引：10

作者：

Long, Tao ^{[1
,2
]}

Clement, Stephen W. J. ^{[1
]}

Xie, Hangqiang ^{[1
]}

Liu, Dunyi ^{[1
,2
]}

机构：

[1] Chinese Acad Geol Sci, Inst Geol, Beijing, Peoples R China

[2] Beijing SHRIMP Ctr, Beijing, Peoples R China

来源：

INTERNATIONAL JOURNAL OF MASS SPECTROMETRY | 2020年 / 450卷

基金：

中国国家自然科学基金;

关键词：

TOF-SIMS; Rare earth elements; Ti content; Double reflectron; DETRITAL ZIRCONS; ICP-MS; ION; LASER;

D O I：

10.1016/j.ijms.2019.116289

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

A new TOF-SIMS with high spatial and mass resolution has been constructed and applied to the in-situ micro-scale analysis of trace elements in geological materials with complex structural and chemical features. Double second-order reflectrons without mesh between different electric field regions of achieve greatly improved secondary ion transmission and mass resolution. The new TOF-SIMS can produce an O-2(-) beam of ca. 5 mu m diameter with a beam intensity of ca. 5 nA and a secondary ion mass resolution of more than 20,000 (FWHM). Functionality has been demonstrated by the analysis of Ti and rare earth elements in zircon. (C) 2020 Elsevier B.V. All rights reserved.

引用

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