Practical electron tomography guide: Recent progress and future opportunities

被引：35

作者：

Hayashida, Misa ^{[1
]}

Malac, Marek ^{[1
]}

机构：

[1] Natl Inst Nanotechnol, 11421 Saskatchewan Dr, Edmonton, AB T6G 2M9, Canada

来源：

MICRON | 2016年 / 91卷

关键词：

Electron tomography; Sample preparation; Radiation damage; Missing wedge; High accuracy alignment; Tilt angle measurement; Volume reconstruction; Image segmentation; Volume projection; BEAM-INDUCED DEPOSITION; MARKER-FREE ALIGNMENT; TILT-SERIES; IMAGE-RECONSTRUCTION; COMPUTED-TOMOGRAPHY; RADIATION-DAMAGE; ENERGY-LOSS; ITERATIVE RECONSTRUCTION; AUTOMATIC ALIGNMENT; PHASE-CONTRAST;

D O I：

10.1016/j.micron.2016.09.010

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We present a review of the recent progress in electron tomography applicable to materials science samples. We focus on practical high accuracy tomographic measurements and their applications. We follow the steps leading to a reconstructed 3D volume and discuss the effect of the individual steps on the suitability of the resulting 3D volume for quantitative measurements. Both the progress in applications and new opportunities in electron tomography in materials science are reviewed. Crown Copyright (C) 2016 Published by Elsevier Ltd. All rights reserved.

引用

页码：49 / 74

页数：26

共 187 条

[111] Equally sloped tomography with oversampling reconstruction -: art. no. 052103 [J].

Miao, JW ;

Förster, F ;

Levi, O .

PHYSICAL REVIEW B, 2005, 72 (05)

[112] 3D electron microscopy in the physical sciences: the development of Z-contrast and EFTEM tomography [J].

Midgley, PA ;

Weyland, M .

ULTRAMICROSCOPY, 2003, 96 (3-4) :413-431

[113] Electron tomography and holography in materials science [J].

Midgley, Paul A. ;

Dunin-Borkowski, Rafal E. .

NATURE MATERIALS, 2009, 8 (04) :271-280

[114] Rapid low dose electron tomography using a direct electron detection camera [J].

Migunov, Vadim ;

Ryll, Henning ;

Zhuge, Xiaodong ;

Simson, Martin ;

Strueder, Lothar ;

Batenburg, K. Joost ;

Houben, Lothar ;

Dunin-Borkowski, Rafal E. .

SCIENTIFIC REPORTS, 2015, 5

[115] Spectroscopic electron tomography [J].

Möbus, G ;

Doole, RC ;

Inkson, BJ .

ULTRAMICROSCOPY, 2003, 96 (3-4) :433-451

[116] Nanoscale tomography in materials science [J].

Mobus, Gunter ;

Inkson, Beverley J. .

MATERIALS TODAY, 2007, 10 (12) :18-25

[117] Analysis of diffraction contrast as a function of energy loss in energy-filtered transmission electron microscope imaging [J].

Moore, KT ;

Howe, JM ;

Elbert, DC .

ULTRAMICROSCOPY, 1999, 80 (03) :203-219

[118] A Bayesian approach for suppression of limited angular sampling artifacts in single particle 3D reconstruction [J].

Moriya, Toshio ;

Acar, Erman ;

Cheng, R. Holland ;

Ruotsalainen, Ulla .

JOURNAL OF STRUCTURAL BIOLOGY, 2015, 191 (03) :318-331

[119]

Mott NF., 1965, Theory of Atomic Collisions, V3

[120] Whole-cell imaging of the budding yeast Saccharomyces cerevisiae by high-voltage scanning transmission electron tomography [J].

Murata, Kazuyoshi ;

Esaki, Masatoshi ;

Ogura, Teru ;

Arai, Shigeo ;

Yamamoto, Yuta ;

Tanaka, Nobuo .

ULTRAMICROSCOPY, 2014, 146 :39-45

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