Practical electron tomography guide: Recent progress and future opportunities

被引：33
作者：
Hayashida, Misa [1 ]
Malac, Marek [1 ]
机构：
[1] Natl Inst Nanotechnol, 11421 Saskatchewan Dr, Edmonton, AB T6G 2M9, Canada
来源：
MICRON | 2016年 / 91卷
关键词：
Electron tomography; Sample preparation; Radiation damage; Missing wedge; High accuracy alignment; Tilt angle measurement; Volume reconstruction; Image segmentation; Volume projection; BEAM-INDUCED DEPOSITION; MARKER-FREE ALIGNMENT; TILT-SERIES; IMAGE-RECONSTRUCTION; COMPUTED-TOMOGRAPHY; RADIATION-DAMAGE; ENERGY-LOSS; ITERATIVE RECONSTRUCTION; AUTOMATIC ALIGNMENT; PHASE-CONTRAST;
D O I：
10.1016/j.micron.2016.09.010
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We present a review of the recent progress in electron tomography applicable to materials science samples. We focus on practical high accuracy tomographic measurements and their applications. We follow the steps leading to a reconstructed 3D volume and discuss the effect of the individual steps on the suitability of the resulting 3D volume for quantitative measurements. Both the progress in applications and new opportunities in electron tomography in materials science are reviewed. Crown Copyright (C) 2016 Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：49 / 74
页数：26
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