Theory of the Sr-induced reconstruction of the Si (001) surface

被引:26
作者
Demkov, Alexander A. [1 ]
Zhang, Xiaodong [2 ]
机构
[1] Univ Texas Austin, Dept Phys, Austin, TX 78712 USA
[2] Univ Texas Houston, MD Anderson Canc Ctr, Dept Radiat Phys, Houston, TX 77030 USA
基金
美国国家科学基金会;
关键词
D O I
10.1063/1.2924433
中图分类号
O59 [应用物理学];
学科分类号
摘要
By using first-principles calculations, we theoretically investigate the surface reconstruction caused by the adsorption of Sr on the Si (001) surface. For the Sr coverage below 1/2 monolayer (ML), the system behavior is dominated by the charge transfer between Sr and silicon that results in the "unbuckling" of Si dimers. At a higher coverage, the surface begins to "undimerize." At the 1 ML coverage, a geometric size constraint induces a series of reconstructions such as 3x, 5x, 7x, etc., characterized by 1x1 reconstructed patches separated by a dimer row. Calculations of the surface energy as function of coverage suggest that for 1 ML of Sr 3x, 5x, and 7x reconstructions of the surface are preferred under the Sr rich conditions, which is in good agreement with the experiment. (C) 2008 American Institute of Physics.
引用
收藏
页数:8
相关论文
共 27 条
  • [21] Bonding and diffusion of Ba on a Si(001) reconstructed surface
    Wang, J
    Hallmark, JA
    Marshall, DS
    Ooms, WJ
    Ordejón, P
    Junquera, J
    Sánchez-Portal, D
    Artacho, E
    Soler, JM
    [J]. PHYSICAL REVIEW B, 1999, 60 (07): : 4968 - 4971
  • [22] Mechanism of cleaning Si(100) surface using Sr or SrO for the growth of crystalline SrTiO3 films
    Wei, Y
    Hu, XM
    Liang, Y
    Jordan, DC
    Craigo, B
    Droopad, R
    Yu, Z
    Demkov, A
    Edwards, JL
    Ooms, WJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (04): : 1402 - 1405
  • [23] Properties of epitaxial SrTiO3 thin films grown on silicon by molecular beam epitaxy
    Yu, Z
    Droopad, R
    Ramdani, J
    Curless, JA
    Overgaard, CD
    Finder, JM
    Eisenbeiser, KW
    Wang, J
    Hallmark, JA
    Ooms, WJ
    [J]. ULTRATHIN SIO2 AND HIGH-K MATERIALS FOR ULSI GATE DIELECTRICS, 1999, 567 : 427 - 433
  • [24] Atomic and electronic structure of the Si/SrTiO3 interface -: art. no. 125323
    Zhang, X
    Demkov, AA
    Li, H
    Hu, X
    Wei, Y
    Kulik, J
    [J]. PHYSICAL REVIEW B, 2003, 68 (12)
  • [25] Steps on the (001) SrTiO3 surface
    Zhang, XD
    Demkov, AA
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2002, 20 (04): : 1664 - 1670
  • [26] Zintl E, 1932, Z PHYS CHEM B-CHEM E, V16, P183
  • [27] Internietallische verbindungen
    Zintl, E
    [J]. ANGEWANDTE CHEMIE, 1939, 52 : 1 - 100