Multispectral x-ray and gamma spectrometer

被引:0
作者
Meidinger, A [1 ]
Sloane-Warren, J [1 ]
Kruschwitz, CA [1 ]
Frederickson, P [1 ]
Hilko, RA [1 ]
Berninger, MJ [1 ]
Tunnell, TW [1 ]
Frayer, DK [1 ]
Rosenberry, DV [1 ]
机构
[1] Bechtel Nevada Los Alamos Operat, Los Alamos, NM 87544 USA
来源
HARD X-RAY AND GAMMA-RAY DETECTOR PHYSICS V | 2004年 / 5198卷
关键词
x-ray spectrometer; gamma spectrometer; scintillator;
D O I
10.1117/12.506831
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
It is a well-known fact that the attenuation length of radiation in any dense material increases with radiation energy. We propose a novel method of measuring x-ray and gamma spectra based on this principle. The multi-spectral x-ray and gamma spectrometer concept employs a scintillating material and optical camera system coupled via optical fibers. The optical fibers are placed sequentially, at increasing depth with respect to the radiation path, along the length of the scintillating material. Light generated by the interaction of radiation with the scintillating material is transported to the camera for recording and subsequent analysis. The proposed system will be used to determine the spectrum of incident radiation by deconvolving the radiation spectrum from the optical intensity (as a function of depth) of the recorded signals.
引用
收藏
页码:54 / 61
页数:8
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