Ion-induced erosion of organic self-assembled monolayers

被引：13
|
作者：
Cyganik, P
Postawa, Z
Meserole, CA
Vandeweert, E
Winograd, N
机构：
[1] Jagiellonian Univ, Inst Phys, PL-30059 Krakow, Poland
[2] Penn State Univ, Dept Chem, University Pk, PA 16802 USA
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1999年 / 148卷 / 1-4期
基金：
美国国家科学基金会; 美国国家卫生研究院;
关键词：
ion-beam induced desorption; self-assembled monolayers; STM;
D O I：
10.1016/S0168-583X(98)00751-4
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Laser post-ionization mass spectrometry combined with Scanning Tunneling Microscopy (STM) has been used to investigate processes of ion-stimulated erosion of self-assembled monolayers (SAM) of phenethyl mercaptan C6H5CH2CH2S (PEM) deposited on gold. Results indicate that only PEM fragments are emitted from the surface. Most of the PEM fragments (predominantly C6H5CH2CH3 with m/z = 106) are emitted with thermal kinetic energies. STM images collected on 8 keV H-2(-)-irradiated surfaces with a system tuned to probe electronic states of sulfur atoms show no additional damage induced by irradiation. This indicates that sulfur atoms are not removed from the surface during hydrogen bombardment. It is proposed that the emission of SAM molecules is initiated by chemical reactions which gently break C-S bonds. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：137 / 142
页数：6
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