Pattern formation in hot embossing of thin polymer films

被引:121
作者
Schift, H [1 ]
Heyderman, LJ [1 ]
Maur, MAD [1 ]
Gobrecht, J [1 ]
机构
[1] Paul Scherrer Inst, Lab Micro & Nanotechnol, CH-5232 Villigen, Switzerland
关键词
D O I
10.1088/0957-4484/12/2/321
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We have investigated pattern formation of thin PMMA films during both hot embossing and demoulding of micro- and nanostructures. During filling of the stamp cavities, compressive and capillary effects were observed, and under certain conditions periodic patterns with characteristic length scales formed. In unstructured stamp regions the form of these patterns is affected by local differences in the pressure. For structured stamps, the self-assembly is strongly influenced by the size and the shape of the stamp cavities. Rapid expansion of trapped air resulted in viscous fingering patterns and a dewetting behaviour of the polymer could be observed.
引用
收藏
页码:173 / 177
页数:5
相关论文
共 11 条
  • [1] VISCOUS FLOWS IN 2 DIMENSIONS
    BENSIMON, D
    KADANOFF, LP
    LIANG, SD
    SHRAIMAN, BI
    TANG, C
    [J]. REVIEWS OF MODERN PHYSICS, 1986, 58 (04) : 977 - 999
  • [2] Lithographically induced self-construction of polymer microstructures for resistless patterning
    Chou, SY
    Zhuang, L
    Guo, LJ
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (07) : 1004 - 1006
  • [3] Lithographically induced self-assembly of periodic polymer micropillar arrays
    Chou, SY
    Zhuang, L
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1999, 17 (06): : 3197 - 3202
  • [4] DESHPANDE P, 2000, IN PRESS J VAC SCI B
  • [5] Dynamical instability of thin liquid films between conducting media
    Herminghaus, S
    [J]. PHYSICAL REVIEW LETTERS, 1999, 83 (12) : 2359 - 2361
  • [6] Flow behaviour of thin polymer films used for hot embossing lithography
    Heyderman, LJ
    Schift, H
    David, C
    Gobrecht, J
    Schweizer, T
    [J]. MICROELECTRONIC ENGINEERING, 2000, 54 (3-4) : 229 - 245
  • [7] Thin liquid polymer films rupture via defects
    Jacobs, K
    Herminghaus, S
    Mecke, KR
    [J]. LANGMUIR, 1998, 14 (04) : 965 - 969
  • [8] Critical review: Adhesion in surface micromechanical structures
    Maboudian, R
    Howe, RT
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1997, 15 (01): : 1 - 20
  • [9] EXPERIMENTAL PERTURBATIONS TO SAFFMAN-TAYLOR FLOW
    MCCLOUD, KV
    MAHER, JV
    [J]. PHYSICS REPORTS-REVIEW SECTION OF PHYSICS LETTERS, 1995, 260 (03): : 139 - 185
  • [10] Electrically induced structure formation and pattern transfer
    Schäffer, E
    Thurn-Albrecht, T
    Russell, TP
    Steiner, U
    [J]. NATURE, 2000, 403 (6772) : 874 - 877