Photoluminescence of zirconia films with VUV excitation

被引:31
作者
Lai, LJ
Lu, HC
Chen, HK
Cheng, BM
Lin, MI
Chu, TC
机构
[1] Natl Synchrotron Radiat Res Ctr, Hsinchu 30076, Taiwan
[2] Natl Tsing Hua Univ, Dept Nucl Sci, Hsinchu 30013, Taiwan
[3] Yuanpei Inst Sci & Technol, Dept Radiol Technol, Hsinchu 30015, Taiwan
关键词
photoluminescence; zirconia; VUV;
D O I
10.1016/j.elspec.2005.01.222
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Using synchrotron radiation as a source of VUV excitation, we examined the photoluminescence (PL) of zirconia (ZrO2) films prepared from zirconium propoxide by the sol-gel method at high temperature. X-ray diffraction (XRD) results reveal that ZrO2 films exhibit tetragonal, a mixture of tetragonal and monoclinic, and monoclinic phases at heating temperatures 700, 900 and 1100 degrees C, respectively. Upon VUV excitation, PL of a ZrO2 film in the tetragonal phase has a maximum at 390 nm, for which excitation is most efficient at 164 nm, near the energy gap of the tetragonal phase. PL emission in the monoclinic phase is characterized by a distinctive band at 475 nm, for which excitation is most efficient at 235 nm, near the energy gap of the monoclinic phase. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:865 / 868
页数:4
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