Integrated Optical Addressing of a Trapped Ytterbium Ion

被引：36

作者：

Ivory, M. ^{[1
]}

Setzer, W. J. ^{[1
]}

Karl, N. ^{[1
]}

McGuinness, H. ^{[1
]}

DeRose, C. ^{[1
]}

Blain, M. ^{[1
]}

Stick, D. ^{[1
]}

Gehl, M. ^{[1
]}

Parazzoli, L. P. ^{[1
]}

机构：

[1] Sandia Natl Labs, POB 5800, Albuquerque, NM 87185 USA

来源：

PHYSICAL REVIEW X | 2021年 / 11卷 / 04期

关键词：

Waveguides - Electric fields - Femtosecond lasers - Trapped ions - Heating rate - Microfabrication;

D O I：

10.1103/PhysRevX.11.041033

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report on the characterization of heating rates and photoinduced electric charging on a micro fabricated surface ion trap with integrated waveguides. Microfabricated surface ion traps have received considerable attention as a quantum information platform due to their scalability and manufacturability. Here, we characterize the delivery of 435-nm light through waveguides and diffractive couplers to a single ytterbium ion in a compact trap. We measure an axial heating rate at room temperature of 0.78 1 0.05 q/ms and see no increase due to the presence of the waveguide. Furthermore, the electric field due to charging of the exposed dielectric outcoupler settles under normal operation after an initial shift. The frequency instability after settling is measured to be 0.9 kHz.

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页数：8

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