Resonant Soft X-ray Reflectivity in the Study of Magnetic Properties of Low-Dimensional Systems

被引：8

作者：

Verna, Adriano ^{[1
,2
]}

Capelli, Raffaella ^{[3
,4
,5
]}

Pasquali, Luca ^{[3
,4
,5
]}

机构：

[1] Univ Roma Tre, Dipartimento Sci, Via Vasca Navale 84, I-00146 Rome, Italy

[2] Casaccia RC, ENEA FSN FISS SNI, Via Anguillarese 301, I-00123 Rome, Italy

[3] Univ Modena & Reggio Emilia, Dipartimento Ingn E Ferrari, Via Vivarelli 10, I-41125 Modena, Italy

[4] Consiglio Nazl Ric IOM CNR, Ist Officina Mat, Str Statale 14,Km 163-5 AREA Sci Pk, I-34149 Trieste, Italy

[5] Univ Johannesburg, Dept Phys, POB 524, ZA-2006 Johannesburg, South Africa

来源：

MAGNETOCHEMISTRY | 2021年 / 7卷 / 10期

关键词：

resonant soft X-ray magnetic reflectivity; magnetic circular dichroism; magnetic thin films; DISPERSION-RELATIONS; OPTICAL-CONSTANTS; BEAR BEAMLINE; SUM-RULES; SCATTERING; SURFACE; MULTILAYERS; ABSORPTION; MEDIA; IRON;

D O I：

10.3390/magnetochemistry7100136

中图分类号：

O61 [无机化学];

学科分类号：

070301 ; 081704 ;

摘要：

In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimensional systems is discussed. This technique is particularly appealing in the study of magnetization at buried interfaces and to discriminate single elemental contributions to magnetism, even when this is ascribed to few atoms. The major fields of application are described, including magnetic proximity effects, thin films of transition metals and related oxides, and exchange-bias systems. The fundamental theoretical background leading to dichroism effects in reflectivity is also briefly outlined.</p>

引用

页数：17

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