Charge density and film morphology dependence of charge mobility in polymer field-effect transistors

被引：68

作者：

Shaked, S

Tal, S

Roichman, Y

Razin, A

Xiao, S

Eichen, Y

Tessler, N ^{[1
]}

机构：

[1] Technion Israel Inst Technol, Dept Elect Engn, Ctr Microelect, IL-32000 Haifa, Israel

[2] Technion Israel Inst Technol, Dept Chem, IL-32000 Haifa, Israel

[3] Amer Dye Source Inc, Baie Durfe, PQ H9X 3T6, Canada

来源：

ADVANCED MATERIALS | 2003年 / 15卷 / 11期

关键词：

D O I：

10.1002/adma.200304653

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

A qualitative comparison between the extended disorder model for charge transport and the measured charge density dependence of the field-effect mobility is presented for field-effect transistors (see Figure) using a poly(phenylenevinylene) layer. By varying the film morphology through the use of polymers of different molecular weights, further insight into the role of morphology is gained.

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页码：913 / +

页数：5

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