Investigation of electrical degradation effects in ferroelectric thin film based tunable microwave components

被引：6

作者：

Astafiev, K ^{[1
]}

Sherman, V

Tagantsev, A

Setter, N

Rivkin, T

Ginley, D

机构：

[1] Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, Ceram Lab, CH-1015 Lausanne, Switzerland

[2] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

INTEGRATED FERROELECTRICS | 2002年 / 49卷

关键词：

ferroelectric films; nonlinearity; microwave; degradation effects; tunable devices;

D O I：

10.1080/10584580290171810

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The impact of electrical stressing on the microwave performance of the SrTiO3 films deposited onto different substrates (MgO and LaAlO3) by pulsed laser deposition has been investigated. The most important characteristics of the tunable microwave components like tunability and loss tangent have been monitored. It has been found that electrical degradation effects, being sensitive to the device operating conditions and ferroelectric film properties, are large enough to affect the performance of ferroelectric-based tunable microwave devices within the expected operating time.

引用

页码：103 / 112

页数：10

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