Contactless Microwave Characterization of Encapsulated Graphene p-n Junctions

被引：1
|
作者：
Ranjan, V. [1 ]
Zihlmann, S. [1 ]
Makk, P. [1 ]
Watanabe, K. [2 ]
Taniguchi, T. [2 ]
Schonenberger, C. [1 ]
机构：
[1] Univ Basel, Dept Phys, Klingelbergstr 82, CH-4056 Basel, Switzerland
[2] Natl Inst Mat Sci, 1-1 Namiki, Tsukuba, Ibaraki 3050044, Japan
来源：
PHYSICAL REVIEW APPLIED | 2017年 / 7卷 / 05期
基金：
瑞士国家科学基金会;
关键词：
ELECTRONIC-PROPERTIES; SPECTROSCOPY; TRANSPORT;
D O I：
10.1103/PhysRevApplied.7.054015
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Accessing intrinsic properties of a graphene device can be hindered by the influence of contact electrodes. Here, we capacitively couple graphene devices to superconducting resonant circuits and observe clear changes in the resonance frequency and widths originating from the internal charge dynamics of graphene. This allows us to extract the density of states and charge relaxation resistance in graphene p-n junctions without the need for electrical contacts. The presented characterization paves a fast, sensitive, and noninvasive measurement of graphene nanocircuits.
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页数：6
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