共 33 条
- [2] Electronic properties of hot-wire deposited nanocrystalline silicon [J]. AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 1998, 507 : 921 - 926
- [3] INSITU ELLIPSOMETRY OF THIN-FILM DEPOSITION - IMPLICATIONS FOR AMORPHOUS AND MICROCRYSTALLINE SI GROWTH [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1989, 7 (05): : 1155 - 1164
- [5] Electronic states in hydrogenated microcrystalline silicon [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1998, 77 (03): : 805 - 830
- [6] FINGER F, 2002, MAT RES SOC S P, V715
- [7] Structural properties of microcrystalline silicon in the transition from highly crystalline to amorphous growth [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1998, 77 (06): : 1447 - 1460
- [9] KAMEI T, 2001, MAT RES SOC S P, V664
- [10] Paramagnetic defects in undoped microcrystalline silicon deposited by the hot-wire technique [J]. AMORPHOUS AND MICROCRYSTALLINE SILICON TECHNOLOGY-1998, 1998, 507 : 793 - 798