In situ SEM observation of fracture processes in thin film of poly(methyl methacrylate)

被引：0
|
作者：
Nishiura, T [1 ]
Nishijima, S [1 ]
机构：
[1] Osaka Univ, Inst Sci & Ind Res, Ibaraki, Osaka 5670047, Japan
来源：
POLYMER JOURNAL | 2001年 / 33卷 / 10期
关键词：
in situ observation; scanning electron microscope (SEM); craze; fracture; poly(methyl methacrylate) (PMMA); film;
D O I：
10.1295/polymj.33.819
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
A fracture test of the poly(methyl methacrylates) (PMMA) thin films was performed to investigate the dynamic fracture processes of polymer on a microscopic scale. The test was conducted using scanning electron microscope (SEM) and the fracture processes of the film were in situ observed. Thin films of the PMMA were produced by pulling glass microscope slides from the solution and glass slides were heated to evaporate toluene at 60°C. Change of craze to crack and craze generation were observed dynamically.
引用
收藏
页码：819 / 820
页数：2
相关论文
共 37 条
1234