Planning Simple Step-Stress Accelerated Life Tests Using Bayesian Methods

被引:36
作者
Yuan, Tao [1 ]
Liu, Xi [1 ]
Kuo, Way [2 ]
机构
[1] Ohio Univ, Dept Ind & Syst Engn, Athens, OH 45701 USA
[2] City Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China
基金
美国国家科学基金会;
关键词
Accelerated life tests; Bayesian approach; cumulative exposure model; Weibull distribution; OPTIMAL-DESIGN; MODEL; INFERENCE; PLANS;
D O I
10.1109/TR.2011.2170104
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This study proposes Bayesian methods for planning optimal simple step-stress accelerated life tests. The Bayesian approach is an attractive alternative to the maximum likelihood method when there is uncertainty in the planning values of the model parameters. The uncertainty in the planning values is described by a joint prior distribution of the model parameters. The optimization criterion is defined as minimization of the pre-posterior variance of the logarithm of a quantile life at the normal stress condition. Two optimization algorithms, one based on Monte Carlo integration, and the other based on large-sample approximation, are developed to find the optimal plans. Nonparametric kernel smoothing technique is adopted in both algorithms to reduce the computational time. The proposed Bayesian approach is also extended to the design of three-level step-stress accelerated life tests. Effects of prior and sample size on the optimal plans are also investigated. Results indicate that both the prior, and the sample size affect the optimal Bayesian plans. And under certain conditions, the Bayesian approach, and the maximum likelihood approach provide very similar optimal plans.
引用
收藏
页码:254 / 263
页数:10
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