Application of Different Methods to Quantify Uncertainty in Specific Absorption Rate Calculation Using a CAD-Based Mobile Phone Model

被引:31
作者
Cheng, Xi [1 ]
Monebhurrun, Vikass [1 ]
机构
[1] CentraleSupelec, EXPOSE PIEM GEEPS, 11 Rue Joliot Curie Plateau Moulon, F-91192 Gif Sur Yvette, France
关键词
Combined uncertainties; computer-aided design (CAD) model; nonintrusive uncertainty quantification (UQ) methods; parameter UQ; sensitivity analysis (SA); specific absorption rate (SAR);
D O I
10.1109/TEMC.2016.2605127
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper focuses on parameter uncertainty quantification (UQ) in specific absorption rate (SAR) calculation using a computer-aided design mobile phone model. The uncertainty in SAR calculation is quantified by three nonintrusive UQ methods: unscented transformation, stochastic collocation, and nonintrusive polynomial chaos. Their performances for the cases of one and two random variables are analyzed. To simplify the UQ procedure for the case of multiple uncertain inputs, it is demonstrated that uncertainties can be combined to evaluate the parameter uncertainty of the output. To quantify the relative importance of each uncertain input parameter with respect to the uncertainty of the output, the polynomial chaos based Sobol' indices method is used in SAR calculation for sensitivity analysis. The results of the investigations are presented and discussed.
引用
收藏
页码:14 / 23
页数:10
相关论文
共 26 条
[1]  
[Anonymous], 2005, 622091 ISIEC
[2]  
[Anonymous], 2008, JCGM
[3]  
[Anonymous], 2013, IEEEIEC627043
[4]  
[Anonymous], 2013, IEEEIEC627041
[5]   Comparisons of computed mobile phone induced SAR in the SAM phantom to that in anatomically correct models of the human head [J].
Beard, Brian B. ;
Kainz, Wolfgang ;
Onishi, Teruo ;
Iyama, Takahiro ;
Watanabe, Soichi ;
Fujiwara, Osamu ;
Wang, Jianqing ;
Bit-Babik, Giorgi ;
Faraone, Antonio ;
Wiart, Joe ;
Christ, Andreas ;
Kuster, Niels ;
Lee, Ae-Kyoung ;
Kroeze, Hugo ;
Siegbahn, Martin ;
Keshvari, Jafar ;
Abrishamkar, Houman ;
Simon, Winfried ;
Manteuffel, Dirk ;
Nikoloski, Neviana .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2006, 48 (02) :397-407
[6]  
Clemens M, 2000, IEEE T MAGN, V36, P1448, DOI 10.1109/20.877711
[7]   Polynomial chaos expansion for sensitivity analysis [J].
Crestaux, Thierry ;
Le Maitre, Olivier ;
Martinez, Jean-Marc .
RELIABILITY ENGINEERING & SYSTEM SAFETY, 2009, 94 (07) :1161-1172
[8]   Efficient computation of stochastic electromagnetic problems using unscented transforms [J].
de Menezes, L. R. A. X. ;
Ajayi, A. ;
Christopoulos, C. ;
Sewell, P. ;
Borges, G. A. .
IET SCIENCE MEASUREMENT & TECHNOLOGY, 2008, 2 (02) :88-95
[9]   Uncertainty Analyses in the Finite-Difference Time-Domain Method [J].
Edwards, Robert S. ;
Marvin, Andrew C. ;
Porter, Stuart J. .
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2010, 52 (01) :155-163
[10]  
Eldred M., 2006, SIAM J SCI COMPUT, V28, P751