Synthesizing and Characterizing Graphene via Raman Spectroscopy: An Upper-Level Undergraduate Experiment That Exposes Students to Raman Spectroscopy and a 2D Nanomaterial
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作者:
Parobek, David
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Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USAUniv Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Parobek, David
[1
]
Shenoy, Ganesh
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Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USAUniv Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Shenoy, Ganesh
[1
]
Zhou, Feng
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Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USAUniv Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Zhou, Feng
[1
]
Peng, Zhenbo
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Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Ningbo Polytech, Chem Engn Coll, 1069 Xinda Rd, Ningbo 315800, Zhejiang, Peoples R ChinaUniv Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Peng, Zhenbo
[1
,2
]
Ward, Michelle
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Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USAUniv Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Ward, Michelle
[1
]
Liu, Haitao
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Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USAUniv Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
Liu, Haitao
[1
]
机构:
[1] Univ Pittsburgh, Dept Chem, Pittsburgh, PA 15260 USA
[2] Ningbo Polytech, Chem Engn Coll, 1069 Xinda Rd, Ningbo 315800, Zhejiang, Peoples R China
In this upper-level undergraduate experiment, students utilize micro-Raman spectroscopy to characterize graphene prepared by mechanical exfoliation and chemical vapor deposition (CVD). The mechanically exfoliated samples are prepared by the students while CVD graphene can be purchased or obtained through outside sources. Owing to the intense Raman signal of a few-layer graphene on a 300 nm thermal oxide silicon wafer, students can learn how different instrumental parameters used in Raman microscopy affect the quality of the measurement. This experiment gives students a first-hand experience in the production of a two-dimensional nanomaterial and exposes them to the utility of micro-Raman spectroscopy as a characterization technique.
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页码:1798 / 1803
页数:6
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[1]
Bae S, 2010, NAT NANOTECHNOL, V5, P574, DOI [10.1038/NNANO.2010.132, 10.1038/nnano.2010.132]
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Bolotin, K. I.
;
Sikes, K. J.
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Columbia Univ, Dept Appl Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Sikes, K. J.
;
Jiang, Z.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Natl High Magnet Field Lab, Tallahassee, FL 32310 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Jiang, Z.
;
Klima, M.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Klima, M.
;
Fudenberg, G.
论文数: 0引用数: 0
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Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Fudenberg, G.
;
Hone, J.
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机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Hone, J.
;
Kim, P.
论文数: 0引用数: 0
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机构:
Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Kim, P.
;
Stormer, H. L.
论文数: 0引用数: 0
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机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Appl Phys, New York, NY 10027 USA
Alcatel Lucent Technol, Bell Labs, Murray Hill, NJ 07974 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Bolotin, K. I.
;
Sikes, K. J.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Appl Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Sikes, K. J.
;
Jiang, Z.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Natl High Magnet Field Lab, Tallahassee, FL 32310 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Jiang, Z.
;
Klima, M.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Klima, M.
;
Fudenberg, G.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Fudenberg, G.
;
Hone, J.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Mech Engn, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Hone, J.
;
Kim, P.
论文数: 0引用数: 0
h-index: 0
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Columbia Univ, Dept Phys, New York, NY 10027 USAColumbia Univ, Dept Phys, New York, NY 10027 USA
Kim, P.
;
Stormer, H. L.
论文数: 0引用数: 0
h-index: 0
机构:
Columbia Univ, Dept Phys, New York, NY 10027 USA
Columbia Univ, Dept Appl Phys, New York, NY 10027 USA
Alcatel Lucent Technol, Bell Labs, Murray Hill, NJ 07974 USAColumbia Univ, Dept Phys, New York, NY 10027 USA