Dependence of stress intensity factors on elastic constants for cracks in an orthotropic bimaterial with a thin film

被引：17

作者：

Beom, H. G. ^{[1
]}

Cui, C. B. ^{[1
]}

Jang, H. S. ^{[1
]}

机构：

[1] Inha Univ, Dept Mech Engn, Inchon 402751, South Korea

来源：

INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES | 2012年 / 49卷 / 23-24期

基金：

新加坡国家研究基金会;

关键词：

Interface crack; Subinterface crack; Orthotropic material; Thin film; Stress intensity factor; DISSIMILAR ANISOTROPIC MEDIA; INTERFACIAL CRACK; SUBSTRATE; DELAMINATION; LAYERS;

D O I：

10.1016/j.ijsolstr.2012.08.002

中图分类号：

O3 [力学];

学科分类号：

08 ; 0801 ;

摘要：

An interface crack and a subinterface crack in an orthotropic bimaterial structure consisting of a thin film and a half plane substrate are analyzed. The orthotropic bimaterial structure is subjected to compressive load and bending moment per unit thickness. Complete expressions of stress intensity factors for the two cracks are obtained based on the path independence of the J integral, apart from one dimensionless parameter undetermined each. The dependence of the dimensionless parameters on material constants is examined. A reduction of the number of necessary material parameters for the parameters is made based upon the modified Stroh formalism. The explicit dependence of the dimensionless parameters on one orthotropic parameter for the film is determined by using the orthotropy rescaling technique. Variations of the dimensionless parameters with the other material parameters are also obtained through numerical computations. (C) 2012 Elsevier Ltd. All rights reserved.

引用

页码：3461 / 3471

页数：11

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