A Low Noise and Linearity Improvement CMOS Image Sensor for Surveillance Camera with Skew-Relaxation Local Multiply Circuit and On-Chip Testable Ramp Generator

被引：2
作者：
Saito, Wataru [1 ]
Iizuka, Yoichi [1 ]
Kato, Norihito [1 ]
Otake, Ryota [1 ]
Morishita, Fukashi [1 ]
机构：
[1] Renesas Elect Corp, Tokyo, Japan
来源：
IEEE ASIAN SOLID-STATE CIRCUITS CONFERENCE (A-SSCC 2021) | 2021年
关键词：
D O I：
10.1109/A-SSCC53895.2021.9634710
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页数：3
相关论文
共 12 条
  • [1] Al Abbas T, 2019, SYMP VLSI CIRCUITS, pC260, DOI 10.23919/VLSIC.2019.8777979
  • [2] Arai T, 2016, ISSCC DIG TECH PAP I, V59, P126, DOI 10.1109/ISSCC.2016.7417939
  • [3] An Area-Efficient and Low-Power 12-b SAR/Single-Slope ADC Without Calibration Method for CMOS Image Sensors
    Kim, Min-Kyu
    Hong, Seong-Kwan
    Kwon, Oh-Kyong
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2016, 63 (09) : 3599 - 3604
  • [4] Kondo S, 2020, ISSCC DIG TECH PAP I, P94, DOI 10.1109/ISSCC19947.2020.9063148
  • [5] A 1-μs Ramp Time 12-bit Column-Parallel Flash TDC-Interpolated Single-Slope ADC With Digital Delay-Element Calibration
    Levski, Deyan
    Wany, Martin
    Choubey, Bhaskar
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2019, 66 (01) : 54 - 67
  • [6] Morishita F., 2021, 2021 S VLSI CIRCUITS, P1, DOI 10.23919/VLSICircuits52068.2021.9492514
  • [7] An ADC Test Technique With Dual-Path/Multi-Functional Fine Pattern Generator Realizing High Accuracy Measurement for CMOS Image Sensor
    Morishita, Fukashi
    Otsuka, Masanori
    Saito, Wataru
    [J]. 2020 IEEE 29TH ASIAN TEST SYMPOSIUM (ATS), 2020, : 184 - 189
  • [8] A Single Slope ADC With Row-Wise Noise Reduction Technique for CMOS Image Sensor
    Nie, Kaiming
    Zha, Wanbin
    Shi, Xiaolin
    Li, Jiawen
    Xu, Jiangtao
    Ma, Jianguo
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS, 2020, 67 (09) : 2873 - 2882
  • [9] 8.3 M-Pixel 480-fps Global-Shutter CMOS Image Sensor with Gain-Adaptive Column ADCs and Chip-on-Chip Stacked Integration
    Oike, Yusuke
    Akiyama, Kentaro
    Hung, Luong D.
    Niitsuma, Wataru
    Kato, Akihiko
    Sato, Mamoru
    Kato, Yuri
    Nakamura, Wataru
    Shiroshita, Hiroshi
    Sakano, Yorito
    Kitano, Yoshiaki
    Nakamura, Takuya
    Toyama, Takayuki
    Iwamoto, Hayato
    Ezaki, Takayuki
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2017, 52 (04) : 985 - 993
  • [10] A 3.7 M-Pixel 1300-fps CMOS Image Sensor With 5.0 G-Pixel/s High-Speed Readout Circuit
    Okura, Shunsuke
    Nishikido, Osamu
    Sadanaga, Yusuke
    Kosaka, Yasuhiro
    Araki, Norihiko
    Ueda, Kazuhiro
    Morishita, Fukashi
    [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 2015, 50 (04) : 1016 - 1024
12