Ion beam triangulation of surfaces and ultrathin films

被引：3
|
作者：
Pfandzelter, R [1 ]
Bernhard, T [1 ]
Winter, H [1 ]
机构：
[1] Humboldt Univ, Inst Phys, D-10115 Berlin, Germany
来源：
SURFACE REVIEW AND LETTERS | 2003年 / 10卷 / 2-3期
关键词：
D O I：
10.1142/S0218625X03005104
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Ion beam triangulation is a real space technique to probe structures of surfaces and ultrathin films. In-plane arrangement of surface atoms is provided from enhanced kinetic electron emission yields for the transition from planar to axial surface channeling. The technique is applied to clean (001) surfaces of fcc Cu and bcc Fe as well as ultrathin films of Mn and Co, epitaxially grown on these surfaces at different temperatures.
引用
收藏
页码：399 / 403
页数：5
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