Apparent volume dependence of 1/f noise in thin film structures:: Role of contacts

被引：29

作者：

Barone, C. ^{[1
,2
]}

Pagano, S. ^{[1
,3
]}

Mechin, L. ^{[4
]}

Routoure, J. -M. ^{[4
]}

Orgiani, P. ^{[1
,2
]}

Maritato, L. ^{[1
,2
]}

机构：

[1] Univ Salerno, CNR, INFM Coherentia, I-84081 Salerno, Italy

[2] Univ Salerno, Dipartimento Matemat & Informat, I-84081 Salerno, Italy

[3] Univ Salerno, Dipartimento Fis ER Caianiello, I-84081 Salerno, Italy

[4] Univ Caen Basse Normandie, GREYC, CNRS,ENSICAEN, UMR 6072, F-14050 Caen, France

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 05期

关键词：

D O I：

10.1063/1.2929830

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The experimental investigation of low-frequency noise properties in new materials is very useful for the understanding of the involved physical transport mechanisms. In this paper it is shown that, when contact noise is present, the experimental values of the normalized Hooge parameter show a fictitious linear dependence on the volume of the analyzed samples. Experimental data on noise measurements of La0.7Sr0.3MnO3 thin films are reported to demonstrate the validity of the analysis performed. (C) 2008 American Institute of Physics.

引用

页数：3

共 18 条

[1] Experimental technique for reducing contact and background noise in voltage spectral density measurements [J].

Barone, C. ;

Galdi, A. ;

Pagano, S. ;

Quaranta, O. ;

Mechin, L. ;

Routoure, J-M ;

Perna, P. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (09)

[2] RESISTANCE AND 1/F NOISE OF AU, AL, AND GE CONTACTS TO (HG,CD)TE [J].

BECK, WA ;

DAVIS, GD ;

GOLDBERG, AC .

JOURNAL OF APPLIED PHYSICS, 1990, 67 (10) :6340-6346

[3] LOW-FREQUENCY FLUCTUATIONS IN SOLIDS - 1-F NOISE [J].

DUTTA, P ;

HORN, PM .

REVIEWS OF MODERN PHYSICS, 1981, 53 (03) :497-516

[4] Low-frequency noise in La0.7Sr0.3Mn1-xFexO3 thin films [J].

Han, KH ;

Huang, Q ;

Ong, PC ;

Ong, CK .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2002, 14 (26) :6619-6625

[5] 1/F NOISE IS NO SURFACE EFFECT [J].

HOOGE, FN .

PHYSICS LETTERS A, 1969, A 29 (03) :139-&

[6]

Kogan S., 1996, Electronic Noise and Fluctuations in Solids, Electron

[7] Studies of 1/f noise in La1-xMxMnO3 (M = Sr, Pb) epitaxial thin films [J].

Lisauskas, A ;

Khartsev, SI ;

Grishin, AM .

JOURNAL OF LOW TEMPERATURE PHYSICS, 1999, 117 (5-6) :1647-1651

[8]

Palanisami A, 2002, PHYS REV B, V66, DOI 10.1103/PhysRevB.66.092407

[9] Correlation between magnetic homogeneity, oxygen content, and electrical and magnetic properties of perovskite manganite thin films [J].

Rajeswari, M ;

Shreekala, R ;

Goyal, A ;

Lofland, SE ;

Bhagat, SM ;

Ghosh, K ;

Sharma, RP ;

Greene, RL ;

Ramesh, R ;

Venkatesan, T ;

Boettcher, T .

APPLIED PHYSICS LETTERS, 1998, 73 (18) :2672-2674

[10] Direct correlation between 1/f magnetonoise and magnetoresistance in La0.7Sr0.3MnO3 and (La0.5Pr0.2)Ba0.3MnO3 manganites [J].

Rana, D. S. ;

Ziese, M. ;

Malik, S. K. .

PHYSICAL REVIEW B, 2006, 74 (09)

← 1 2 →