Improved microwave dielectric properties of novel low-permittivity Sn-doped Ca2HfSi4O12 ceramics

被引:24
作者
Du, Kang [1 ,2 ]
Song, Xiao-Qiang [1 ,2 ]
Zou, Zheng-Yu [1 ,2 ]
Fan, Jun [1 ,2 ]
Lu, Wen-Zhong [1 ,2 ]
Lei, Wen [1 ,2 ]
机构
[1] Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan 430074, Peoples R China
[2] Minist Educ, Key Lab Funct Mat Elect Informat B, Wuhan 430074, Peoples R China
基金
中国国家自然科学基金;
关键词
Ca2HfSi4O12; ceramic; Sn4+ substitution for Hf4+; Phase composition; Microwave dielectric properties; CRYSTAL-STRUCTURE; PHASE EVOLUTION; SILICATE;
D O I
10.1016/j.materresbull.2020.110887
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The phase compositions and microwave dielectric properties of Ca-2(Hf1-xSnx)Si4O12 (0 <= x <= 0.5) were investigated by the solid-state reaction method. A single-phase ceramic with monoclinic structure was formed in the Ca-2(Hf1-xSnx)Si4O12 (0 <= x <= 0.2) ceramic. At 0.25 <= x <= 0.5, CaSiO3 and CaSnSiO5 second phases appeared. The microwave dielectric properties of a novel Ca2HfSi4O12 ceramic (epsilon(r) = 8.1, Q x f = 39,700 GHz and tau(f) = -12.7 ppm/degrees C) were obtained. Partial substitution of Sn4+ for Hf4+ could reduce its relative permittivity and improve quality factor, and the highest quality factor of 49,500 GHz was obtained at x = 0.2. The tau(f )value of Ca-2(Hf1-xSnx)Si4O12 ceramics could be controlled to a near-zero value by the CaSnSiO5 second phase when x > 0.3. The optimum microwave dielectric properties (epsilon(r) = 8.0, Q x f = 37,100 GHz and tau(f) = -7.2 ppm/degrees C) were achieved in the Ca-2(Hf1-xSnx)Si4O12 (x = 0.4) ceramic.
引用
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页数:6
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