Soft x-ray scattering facility at the Advanced Light Source with real-time data processing and analysis

被引：423

作者：

Gann, E. ^{[2
]}

Young, A. T. ^{[1
]}

Collins, B. A. ^{[2
]}

Yan, H. ^{[1
,2
]}

Nasiatka, J. ^{[1
]}

Padmore, H. A. ^{[1
]}

Ade, H. ^{[2
]}

Hexemer, A. ^{[1
]}

Wang, C. ^{[1
]}

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA

[2] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2012年 / 83卷 / 04期

关键词：

CARBON CONTAMINATION; NEUTRON-SCATTERING; HIGH-RESOLUTION; THIN-FILMS; SYNCHROTRON; REFLECTIVITY; MISCIBILITY; MICROSCOPY; BEAMLINE; SURFACES;

D O I：

10.1063/1.3701831

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We present the development and characterization of a dedicated resonant soft x-ray scattering facility. Capable of operation over a wide energy range, the beamline and endstation are primarily used for scattering from soft matter systems around the carbon K-edge (similar to 285 eV). We describe the specialized design of the instrument and characteristics of the beamline. Operational characteristics of immediate interest to users such as polarization control, degree of higher harmonic spectral contamination, and detector noise are delineated. Of special interest is the development of a higher harmonic rejection system that improves the spectral purity of the x-ray beam. Special software and a user-friendly interface have been implemented to allow real-time data processing and preliminary data analysis simultaneous with data acquisition. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3701831]

引用

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