DWCNT;
field emission;
current density;
boron doping;
D O I:
10.4283/JMAG.2012.17.1.009
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
Attempts to dope carbon nanotube (CNT) with impurities in order to control the electronic properties of the CNT is a natural course of action. Boron is known to improve both the structural and electronic properties. In this report, we study the field emission properties of Boron-doped double-walled CNT (DWCNT). Boron-doped DWCNT films were fabricated by catalytic decomposition of tetrahydrofuran and triisopropyl borate over a Fe-Mo/MgO catalyst at 900 degrees C. We measured the field emission current by varying the doping amount of Boron from 0.8 to 1.8 wt%. As the amount of doped boron in the DWCNT increases, the turn-on-field of the DWCNT decreases drastically from 6 V/mu m to 2 V/mu m. The current density of undoped CNT is 0.6 mA/cm(2) at 9 V, but a doped-DWCNT sample with 1.8 wt% achieved the same current density only at only 3.8 V. This shows that boron doped DWCNTs are potentially useful in low voltage operative field emitting device such as large area flat panel displays.
机构:
Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R ChinaChinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Zeng, XB
Liao, XB
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Liao, XB
Bo, W
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Bo, W
Diao, HW
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Diao, HW
Dai, ST
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Dai, ST
Xiang, XB
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Xiang, XB
Chang, XL
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Chang, XL
Xu, YY
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Xu, YY
Hu, ZH
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Hu, ZH
Hao, HY
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
Hao, HY
Kong, GL
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机构:Chinese Acad Sci, Inst Semicond, State Key Lab Surface Phys, Beijing 100083, Peoples R China
机构:
Alagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, IndiaAlagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, India
Thirumal, V.
Pandurangan, A.
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Anna Univ, Dept Chem, Madras 600025, Tamil Nadu, IndiaAlagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, India
Pandurangan, A.
Jayavel, R.
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Anna Univ, Ctr Nanosci & Technol, Madras 600025, Tamil Nadu, IndiaAlagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, India
Jayavel, R.
Krishnamoorthi, S. R.
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Alagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, IndiaAlagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, India
Krishnamoorthi, S. R.
Ilangovan, R.
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机构:
Univ Madras, Natl Ctr Nanosci & Nanotechnol, Guindy Campus, Madras 600025, Tamil Nadu, IndiaAlagappa Univ, Dept Nanosci & Technol, Nanoelect Lab, Karaikkudi 630004, Tamil Nadu, India