Bidimensional Statistical Empirical Mode Decomposition

被引：26

作者：

Kim, Donghoh ^{[1
]}

Park, Minjeong ^{[2
]}

Oh, Hee-Seok ^{[2
]}

机构：

[1] Sejong Univ, Dept Appl Math, Seoul 143747, South Korea

[2] Seoul Natl Univ, Dept Stat, Seoul 151747, South Korea

来源：

IEEE SIGNAL PROCESSING LETTERS | 2012年 / 19卷 / 04期

基金：

新加坡国家研究基金会;

关键词：

Bidimensional empirical mode decomposition; frequency; sifting; smoothing;

D O I：

10.1109/LSP.2012.2186566

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This letter proposes a new algorithm, termed bidimensional statistical empirical mode decomposition (BSEMD) that adopts a smoothing procedure instead of an interpolation when constructing 2-D upper and lower envelopes. For this purpose, we investigate the sifting process effect of conventional bidimensional empirical mode decomposition (BEMD) on the decomposition results, and propose a modified BEMD via the smoothing sifting process coupling with a new identification method of 2-D local extrema. Furthermore, theoretical rationale for smoothing sifting is investigated.

引用

页码：191 / 194

页数：4

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