Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurements

被引:20
作者
Dong, Jie [1 ]
Wang, Shengjia [1 ]
Lu, Min [1 ]
Jakobi, Martin [1 ]
Liu, Zhanwei [2 ]
Dong, Xingchen [1 ]
Poeller, Franziska [1 ]
Bilgeri, Laura Maria [1 ]
Salazar Bloise, Felix [3 ]
Yetisen, Ali K. [1 ]
Koch, Alexander Walter [1 ]
机构
[1] Tech Univ Munich, Inst Measurement Syst & Sensor Technol, Arcisstr 21, D-80333 Munich, Germany
[2] Beijing Inst Technol, Sch Aerosp Engn, Beijing 100081, Peoples R China
[3] Univ Politecn Madrid, ETSI Minas & Energia, Rios Rosas 21, Madrid 28003, Spain
来源
OPTICS EXPRESS | 2019年 / 27卷 / 03期
基金
中国国家自然科学基金;
关键词
SPECKLE PATTERN INTERFEROMETRY; DISPLACEMENT; CURVATURE; SLOPE;
D O I
10.1364/OE.27.003276
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A real-time, dual-sensitive shearography system using a single-wavelength laser was developed for simultaneous and dynamic in-plane and out-of-plane strain measurements. The shearography system is capable of measuring crack-tip deformation fields quantitatively. A spatial multiplexing technique based on Fourier transform is employed for simultaneous and dynamic multi-component phase retrieval. Two slit spatial filters and a common-path shearing interferometer are used to obtain an improved phase quality for crack-tip deformation measurements. Mode-I fracture experiments under three-point bending were conducted to validate the feasibility and the capability of this method. (C) 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement
引用
收藏
页码:3276 / 3283
页数:8
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