A new DC-offset and I/Q-mismatch compensation technique for a CMOS direct-conversion WLAN transmitter
被引:5
作者:
Yanagisawa, Kiyoshi
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h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, Japan
Yanagisawa, Kiyoshi
[1
]
Matsuno, Noriaki
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, Japan
Matsuno, Noriaki
[1
]
Maeda, Tadashi
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, Japan
Maeda, Tadashi
[1
]
Tanaka, Shinichi
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, Japan
Tanaka, Shinichi
[1
]
机构:
[1] NEC Corp Ltd, Syst Devices Res Labs, Kanagawa 2118666, Japan
来源:
2007 IEEE/MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-6
|
2007年
关键词:
direct conversion;
DC offset;
I/Q mismatch;
transmitters;
D O I:
10.1109/MWSYM.2007.380260
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
This paper presents a novel DC-offset and I/Q-mismatch compensation technique with short convergence time, high accuracy, and low-circuit-complexity In this technique, all kinds of transmitter nonidealities, i.e. an offset and a mismatch, can be detected using adequate pair of DC test signals. The test signals are designed so that the envelope of the modulator RF outputs for each test signal fluctuates when the offset or mismatch exists. The fluctuations are converted to a baseband signal using an envelope detector which is designed as a signal dynamic range compressor to avoid saturation in following stages. The polarity of this fluctuation is detected by a comparator instead of a multi-bit analog to digital converter, and a binary-search-type algorithm optimizes parameters for the offset and mismatch compensation using the 1-bit comparator output. This technique was demonstrated in a 0.18-mu m CMOS 5-GHz-band WLAN transmitter. The DC offset was suppressed to -43 dBc and the image tone was suppressed to -49 dBc.
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Maeda, T
;
Yano, H
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yano, H
;
Hori, S
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Hori, S
;
Matsuno, N
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Matsuno, N
;
Yamase, T
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yamase, T
;
Tokairin, T
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Tokairin, T
;
Walkington, R
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h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Walkington, R
;
Yoshida, N
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yoshida, N
;
Numata, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Numata, K
;
Yanagisawa, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yanagisawa, K
;
Takahashi, Y
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Takahashi, Y
;
Fujii, M
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Fujii, M
;
Hida, H
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Maeda, T
;
Yano, H
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yano, H
;
Hori, S
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Hori, S
;
Matsuno, N
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Matsuno, N
;
Yamase, T
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yamase, T
;
Tokairin, T
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Tokairin, T
;
Walkington, R
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Walkington, R
;
Yoshida, N
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yoshida, N
;
Numata, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Numata, K
;
Yanagisawa, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Yanagisawa, K
;
Takahashi, Y
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Takahashi, Y
;
Fujii, M
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan
Fujii, M
;
Hida, H
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, JapanNEC Corp Ltd, Syst Devices Res Labs, NEC Cpd Semicond Devices Ltd, Kanagawa 2118666, Japan