Porous silicon as a sacrificial material

被引:102
作者
Bell, TE
Gennissen, PTJ
DeMunter, D
Kuhl, M
机构
[1] DELFT UNIV TECHNOL,DEPT ELECT ENGN,LAB ELECT INSTRUMENTAT,NL-2600 AA DELFT,NETHERLANDS
[2] TECH UNIV CHEMNITZ ZWICKAU,DEPT ELECT ENGN,CTR MICROTECHNOL,D-09107 CHEMNITZ,GERMANY
关键词
D O I
10.1088/0960-1317/6/4/002
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Porous silicon is emerging in micromachining technology as an excellent material for use as a sacrificial layer. This is largely due to the ease of fabrication and freedom of design it allows. The rate of pore formation is heavily dependent upon the doping type and concentration of the silicon, allowing patterned porous silicon formation through selective doping of the substrate. Etch-rates above 10 mm min(-1) have been reported for highly doped material. Silicon that has been made porous can be quickly and easily removed in a dilute hydroxide solution, as low as 1%. Porous silicon technology offers the unique ability to fabricate free-standing structures in single-crystal silicon with separation distances from the substrate ranging from a few microns to over one hundred microns. A review of the development of porous silicon for micromachining applications is given.
引用
收藏
页码:361 / 369
页数:9
相关论文
共 42 条
  • [1] POROUS POLYCRYSTALLINE SILICON - A NEW MATERIAL FOR MEMS
    ANDERSON, RC
    MULLER, RS
    TOBIAS, CW
    [J]. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 1994, 3 (01) : 10 - 18
  • [2] ARITA Y, 1979, REV ELEC COMMUN LAB, V27, P41
  • [3] FORMATION AND PROPERTIES OF POROUS SILICON FILM
    ARITA, Y
    SUNOHARA, Y
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (02) : 285 - 295
  • [4] POROUS SILICON AS A MATERIAL IN MICROSENSOR TECHNOLOGY
    BARRET, S
    GASPARD, F
    HERINO, R
    LIGEON, M
    MULLER, F
    RONGA, I
    [J]. SENSORS AND ACTUATORS A-PHYSICAL, 1992, 33 (1-2) : 19 - 24
  • [5] AN EXPERIMENTAL AND THEORETICAL-STUDY OF THE FORMATION AND MICROSTRUCTURE OF POROUS SILICON
    BEALE, MIJ
    BENJAMIN, JD
    UREN, MJ
    CHEW, NG
    CULLIS, AG
    [J]. JOURNAL OF CRYSTAL GROWTH, 1985, 73 (03) : 622 - 636
  • [6] ANISOTROPIC ETCHING OF SILICON
    BEAN, KE
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (10) : 1185 - 1193
  • [7] BISCHOFF T, 1996, P EUROSENSORS 96, P211
  • [8] PORE-SIZE DISTRIBUTION IN POROUS SILICON STUDIED BY ADSORPTION-ISOTHERMS
    BOMCHIL, G
    HERINO, R
    BARLA, K
    PFISTER, JC
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1983, 130 (07) : 1611 - 1614
  • [9] Branebjerg J., 1991, Proceedings. IEEE Micro Electro Mechanical Systems. An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots (Cat. No.91CH2957-9), P221, DOI 10.1109/MEMSYS.1991.114800
  • [10] Dominguez D., 1993, Journal of Micromechanics and Microengineering, V3, P247, DOI 10.1088/0960-1317/3/4/021