Application of an Al-doped zinc oxide subcontact layer on vanadium-compensated 6H-SiC photoconductive switches

被引:3
作者
Zhou Tian-Yu [1 ,2 ]
Liu Xue-Chao [1 ]
Huang Wei [1 ]
Dai Chong-Chong [1 ,2 ]
Zheng Yan-Qing [1 ]
Shi Er-Wei [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Ceram, Shanghai 201800, Peoples R China
[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China
基金
中国国家自然科学基金; 上海市自然科学基金;
关键词
photoconductive semiconductor switch; SiC; n(+)-AZO subcontact layer; on-state resistance; SILICON-CARBIDE; HIGH-POWER; SEMICONDUCTOR SWITCHES; GROWTH; ZNO; CRYSTALS;
D O I
10.1088/1674-1056/24/4/044209
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Al-doped ZnO thin film (AZO) is used as a subcontact layer in 6H-SiC photoconductive semiconductor switches (PCSSs) to reduce the on-state resistance and optimize the device structure. Our photoconductive test shows that the on-state resistance of lateral PCSS with an n(+)-AZO subcontact layer is 14.7% lower than that of PCSS without an n(+)-AZO subcontact layer. This occurs because a heavy-doped AZO thin film can improve Ohmic contact properties, reduce contact resistance, and alleviate Joule heating. Combined with the high transparance characteristic at 532 nm of AZO film, vertical structural PCSS devices are designed and their structural superiority is discussed. This paper provides a feasible route for fabricating high performance SiC PCSS by using conductive and transparent ZnO-based materials.
引用
收藏
页数:5
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