Combined Kerr-/magnetic force microscopy on NdFeB crystals of different crystallographic orientation

被引：29
作者：
Zueco, E
Rave, W
Schafer, R
Hubert, A
Schultz, L
机构：
[1] IFW Dresden, Inst Met Werkstoffe, D-01069 Dresden, Germany
[2] Univ Erlangen Nurnberg, Inst Werkstoffwissensch, D-91058 Erlangen, Germany
来源：
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1998年 / 190卷 / 1-2期
关键词：
magnetic force microscopy; Kerr microscopy; magnetic domains;
D O I：
10.1016/S0304-8853(98)00268-6
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Magnetic force microscopy images of NdFeB crystals of different crystallographic orientation are directly compared with magneto-optical Kerr images. This comparison facilitates the analysis of contrast mechanisms in the MFM images. Different contributions to the contrast arise from the Zeeman interaction energy between (unperturbed) tip and sample on the one hand and the mutual reaction of their magnetizations to the stray fields. These contributions are separated by forming sum and difference images from pictures taken with opposite tip magnetization. This technique yields complementary images of the surface charge pattern of the sample and its local susceptibility. (C) 1998 Elsevier Science B.V. All rights reserved.
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页码：42 / 47
页数：6
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