Characterization of Porous Polar Semiconductors by Their Optical Spectra in the Region of Phonon and Plasmon-Phonon Excitations

被引:3
作者
Barlas, T. R. [1 ]
Dmitruk, N. L. [1 ]
Serdyuk, V. A. [1 ]
机构
[1] Natl Acad Sci, Lashkarev Inst Phys Semicond, UA-03028 Kiev, Ukraine
关键词
INFRARED REFLECTANCE;
D O I
10.1134/S0030400X1201002X
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Optical properties of porous A(3)B(5) semiconductors (GaAs, InP, and GaP) in the far-infrared region, in particular, the specular reflection and attenuated total reflection, including the excitation regime of surface polaritons, are considered. Considering a porous material as a composite, we performed calculations in the context of the effective medium model using two modifications of it, Maxwell-Garnett and Bruggeman, which correspond to two different topologies of the composite material-matrix and statistical. The effect of porosity of the material and of such parameters as doping, anisotropy, and penetration depth of an electromagnetic wave to a porous material on optical spectra is analyzed. In addition, some experimental data are presented and the adequacy of the performed numerical simulation is demonstrated. DOI: 10.1134/S0030400X1201002X
引用
收藏
页码:233 / 242
页数:10
相关论文
共 18 条
[2]  
Born M., 2006, PRINCIPLES OPTICS
[3]  
Dmitruk N, 2010, PHYS CHEM SOL STATE, V11, P13
[4]  
Dmitruk N., 2009, OPTICS SMALL PARTICL
[5]  
Dmitruk N. L., 2010, 5 INT C MAT SCI COND, P35
[6]  
DMITRUK NL, 1989, SURFACE POLARITONS S
[7]  
[Головань Л.А. Golovan L.A.], 2007, [Успехи физических наук, Uspekhi fizicheskikh nauk], V177, P619
[8]   Electrochemical formation of self-assembled InP nanopore arrays and their use as templates for molecular beam epitaxy growth of InGaAs quantum wires and dots [J].
Hirano, T ;
Ito, A ;
Sato, T ;
Ishikawa, F ;
Hasegawa, H .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (2B) :977-981
[9]   Observation of crossing pores in anodically etched n-GaAs [J].
Langa, S ;
Carstensen, J ;
Christophersen, M ;
Föll, H ;
Tiginyanu, IM .
APPLIED PHYSICS LETTERS, 2001, 78 (08) :1074-1076
[10]   Infrared reflectance of thick p-type porous SiC layers [J].
MacMillan, MF ;
Devaty, RP ;
Choyke, WJ ;
Goldstein, DR ;
Spanier, JE ;
Kurtz, AD .
JOURNAL OF APPLIED PHYSICS, 1996, 80 (04) :2412-2419