Energy consumption analysis of different scratching methods in GaAs mechanical cleavage processing

被引:8
作者
Gao, Rui [1 ]
Jiang, Chen [1 ]
Lang, XiaoHu [2 ]
Huang, PengHui [1 ]
Jiang, JinXin [1 ]
机构
[1] Univ Shanghai Sci & Technol, Coll Mech Engn, Shanghai, Peoples R China
[2] Shanghai Nanpre Mech Co Ltd, Shanghai, Peoples R China
基金
中国国家自然科学基金;
关键词
mechanical cleavage; energy consumption; dot scratching method; GaAs; PERFORMANCE LASER-DIODES; BEHAVIOR;
D O I
10.1088/1361-6641/ac22f4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
High performance and low energy consumption are major priorities for modern manufacturing techniques. In order to improve the quality of cleavage planes while reducing energy consumption, this paper presents an experimental investigation of energy savings during the mechanical cleavage process using different scratching methods. According to the simulation results, an improved scratching method, dot scratching, gave a scratching length of approximately 0.6 mm. The scratching energies of the traditional scratching method and the dot scratching method along the and directions were calculated and analysed from the perspective of energy consumption. A series of scratching and cleavage experiments were carried out to investigate the features on scratch and cleavage surfaces. The experimental results for the scratching procedure showed that scratching along the direction using the dot scratching method is beneficial for reducing the maximum damage width of gallium arsenide (GaAs). The dot scratching method can significantly reduce energy consumption during the cleavage of GaAs, and the energy saving ratios exceed 70%. A flat cleavage plane can be obtained by cleavage using the dot scratching method under a lower scratching load. Adoption of the dot scratching method thus has the potential to improve the efficiency and quality of cleavage processes and offers a practical solution for the greener manufacturing of semiconductor cleavage planes.
引用
收藏
页数:8
相关论文
共 19 条
[1]   Mechanical Behavior Investigation of 4H-SiC Single Crystal at the Micro-Nano Scale [J].
Chai, Peng ;
Li, Shujuan ;
Li, Yan ;
Liang, Lie ;
Yin, Xincheng .
MICROMACHINES, 2020, 11 (01)
[2]   Fundamental study of ductile-regime diamond turning of single crystal gallium arsenide [J].
Chen, Junyun ;
Ding, Fei ;
Luo, Xichun ;
Rao, Xiaoshuang ;
Sun, Jining .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2020, 62 :71-82
[3]   Anisotropy mechanical behavior of crystals based on gallium arsenide cleavage processing [J].
Gao, Rui ;
Jiang, Chen ;
Dong, KangJia ;
Lang, XiaoHu ;
Jiang, JinXin ;
Huang, PengHui .
CERAMICS INTERNATIONAL, 2021, 47 (15) :22138-22146
[4]   Experimental investigation of influence of scratch features on GaAs cleavage plane during cleavage processing using a scratching capability index [J].
Gao, Rui ;
Jiang, Chen ;
Lang, XiaoHu ;
Dong, KangJia ;
Li, FuRong .
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING-GREEN TECHNOLOGY, 2021, 8 (03) :761-770
[5]   On-wafer fabrication of cavity mirrors for InGaN-based laser diode grown on Si [J].
He, Junlei ;
Feng, Meixin ;
Zhong, Yaozong ;
Wang, Jin ;
Zhou, Rui ;
Gao, Hongwei ;
Zhou, Yu ;
Sun, Qian ;
Liu, Jianxun ;
Huang, Yingnan ;
Zhang, Shuming ;
Wang, Huaibing ;
Ikeda, Masao ;
Yang, Hui .
SCIENTIFIC REPORTS, 2018, 8
[6]  
Jiang C, 2019, INT J PR ENG MAN-GT, V6, P1
[7]   Simulation and Experiment on Surface Morphology and Mechanical Properties Response in Nano-Indentation of 6H-SiC [J].
Li, Chen ;
Zhang, Feihu ;
Meng, Binbin ;
Ma, Zhaokai .
JOURNAL OF MATERIALS ENGINEERING AND PERFORMANCE, 2017, 26 (03) :1000-1009
[8]   Electrochromic smart windows using 2D-MoS2 nanostructures protected silver nanowire based flexible transparent electrodes [J].
Mallikarjuna, K. ;
Shinde, Mahesh A. ;
Kim, Heakyoung .
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2020, 117
[9]   Fracture surface analysis and quantitative characterization of gallium arsenide III-V semiconductors using fractography [J].
Moulins, Anthony ;
Dugnani, Roberto ;
Zednik, Ricardo J. .
ENGINEERING FAILURE ANALYSIS, 2021, 123
[10]   Dynamic crack modeling and analytical stress field analysis in single-crystal silicon using quantitative fractography [J].
Moulins, Anthony ;
Ma, Lingyue ;
Dugnani, Roberto ;
Zednik, Ricardo J. .
THEORETICAL AND APPLIED FRACTURE MECHANICS, 2020, 109