Mechanisms responsible for the ultraviolet photosensitivity of SnO2-doped silica -: art. no. 073102

被引:16
作者
Chiodini, N [1 ]
Ghidini, S [1 ]
Paleari, A [1 ]
机构
[1] Univ Milan, Dipartimento Sci Mat, INFM, I-20125 Milan, Italy
来源
PHYSICAL REVIEW B | 2001年 / 64卷 / 07期
关键词
D O I
10.1103/PhysRevB.64.073102
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Tin-doped silica samples were prepared by the sol-gel method. Optical absorption and electron paramagnetic resonance measurements were carried out before and after exposure to 266-nm pulsed radiation from the fourth harmonic of the Nd-YAG (yttrium-aluminum-garnet) laser. The laser-induced change of refractive index was analyzed at different power densities (from 1 to 6 X 10(7) W/cm(2), 6-ns pulse duration) and exposure times. Positive changes of the refractive index up to 4 X 10(-4) were observed. The presence and the consequent laser-induced bleaching of the 5-eV absorption band due to oxygen deficient centers, does not appear relevant, since good positive photosensitivity was observed in samples without detectable absorption at this energy.
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页数:3
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