Calorimetric measurements of optical materials for 193 nm lithography

被引:3
作者
Grenville, A
Uttaro, R
Sedlacek, JHC
Rothschild, M
Corliss, D
机构
[1] INTEL CORP,SANTA CLARA,CA
[2] SEMATECH,DIGITAL SEMICOND,AUSTIN,TX 78741
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1996年 / 14卷 / 06期
关键词
D O I
10.1116/1.588617
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a new calorimetric method to accurately determine the absorption coefficient at 193 nm of optical materials such as fused silica and calcium fluoride. The amount of absorbed radiation is the power consumed by a thermoelectric cooler that maintains the sample at room temperature during exposure with a 193 nm laser. We report initial results from five types of fused silica which indicate that absorption coefficients are still a factor of 3 higher than the target of 0.001 cm(-1) and that batch to batch variations remain common. The absorption coefficient for one grade of calcium fluoride has also been obtained. On one fused silica sample, an upper bound has been placed on the two-photon absorption coefficient at a factor of 2 lower than those previously reported. Measurements have been performed under a variety of vacuum conditions yielding anomalous losses in transmission. (C) 1996 American Vacuum Society.
引用
收藏
页码:4184 / 4187
页数:4
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