RFID Dynamic Performance Measurement System Embedded in Multiscale Deep Learning

被引:2
作者
Li, Lin [1 ]
Yu, Xiaolei [2 ]
Liu, Zhenlu [1 ]
Zhao, Zhimin [1 ]
Zhang, Ke [1 ]
Zhou, Shanhao [1 ]
机构
[1] Nanjing Univ Aeronaut & Astronaut, Coll Sci, Nanjing 210016, Peoples R China
[2] Natl Qual Supervis & Testing Ctr RFID Prod Jiangs, Nanjing 210029, Peoples R China
基金
中国国家自然科学基金;
关键词
Anticollision; computer vision; convolutional neural network; deep learning; dynamic measurement; reading performance; RFID system; YOLOv3; ANTICOLLISION PROTOCOL; IDENTIFICATION; LOCALIZATION; TAGS;
D O I
10.1109/TIM.2021.3068433
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Multitag sensitivity would be affected by electromagnetic coupling during simultaneous reading. The reading distance of multitag depends on the least sensitivity and operating power of all tags, which is an indicator of reading performance. The main purpose of this article is to optimize the reading performance of multitag by embedding deep learning, while the reading distance of multitag changes with the 3-D geometric structure. Dynamic multitag image deblurring based on multiscale convolutional neural network (MCNN) improves image restoration ability and clarity. Also, tag detection from the estimated image via YOLOv3 improved by feature enhancement (YOLOv3_f) can improve the detection ability of small size targets, and mean average precision (mAP) is increased by 16.4%. Finally, the 3-D coordinates of tags in pixel space are converted into 3-D coordinates of world space by a quaternion. Comparing our system with the positioning method without deblurring, the 3-D coordinate structures are tested in the dynamic measurement system. The experimental results show that the reading performance of the designed RFID system has been greatly improved as the number of tags increases. Our scheme can improve the reading distance of multitag from the physical structure and the anticollision ability of the RFID system.
引用
收藏
页数:12
相关论文
共 50 条
  • [41] An Automatic Scoliosis Diagnosis and Measurement System Based on Deep Learning
    Tan, Zhiqiang
    Yang, Kai
    Sun, Yu
    Wu, Bo
    Tao, Huiren
    Hu, Ying
    Zhang, Jianwei
    2018 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND BIOMIMETICS (ROBIO), 2018, : 439 - 443
  • [42] Embedded deep learning in ophthalmology: making ophthalmic imaging smarter
    Teikari, Petteri
    Najjar, Raymond P.
    Schmetterer, Leopold
    Milea, Dan
    THERAPEUTIC ADVANCES IN OPHTHALMOLOGY, 2019, 11
  • [43] Smart Doll: Emotion Recognition Using Embedded Deep Learning
    Luis Espinosa-Aranda, Jose
    Vallez, Noelia
    Maria Rico-Saavedra, Jose
    Parra-Patino, Javier
    Bueno, Gloria
    Sorci, Matteo
    Moloney, David
    Pena, Dexmont
    Deniz, Oscar
    SYMMETRY-BASEL, 2018, 10 (09):
  • [44] Embedded Deep Learning for Sleep Staging
    Turetken, Engin
    Van Zaen, Jerome
    Delgado-Gonzalo, Ricard
    2019 6TH SWISS CONFERENCE ON DATA SCIENCE (SDS), 2019, : 95 - 96
  • [45] Urban traffic monitoring based on deep learning on an embedded GPU
    Nocua, M. Fredy
    Perez-Holguin, Wilson-Javier
    Pardo-Beainy, Camilo
    EXPERT SYSTEMS WITH APPLICATIONS, 2025, 273
  • [46] Automated Segmentation of Median Nerve in Dynamic Sonography Using Deep Learning: Evaluation of Model Performance
    Wu, Chueh-Hung
    Syu, Wei-Ting
    Lin, Meng-Ting
    Yeh, Cheng-Liang
    Boudier-Reveret, Mathieu
    Hsiao, Ming-Yen
    Kuo, Po-Ling
    DIAGNOSTICS, 2021, 11 (10)
  • [47] Deep learning for complex displacement field measurement
    Lan ShiHai
    Su Yong
    Gao ZeRen
    Chen Ye
    Tu Han
    Zhang QingChuan
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2022, 65 (12) : 3039 - 3056
  • [48] Embedded vision system for monitoring arc welding with thermal imaging and deep learning
    Fernandez, Andrea
    Souto, Alvaro
    Gonzalez, Carlos
    Mendez-Rial, Roi
    2020 INTERNATIONAL CONFERENCE ON OMNI-LAYER INTELLIGENT SYSTEMS (IEEE COINS 2020), 2020, : 74 - 79
  • [49] A Multiscale Feature Learning Scheme Based on Deep Learning for Industrial Process Monitoring and Fault Diagnosis
    Yuan, Jing
    Tian, Ying
    IEEE ACCESS, 2019, 7 : 151189 - 151202
  • [50] A System Based on Deep-Learning for Dynamic Routing problems
    Delamer, Jean-Alexis
    Givigi, Sidney
    SYSCON 2022: THE 16TH ANNUAL IEEE INTERNATIONAL SYSTEMS CONFERENCE (SYSCON), 2022,