Strain Engineering for the Kapitza Resistance of the ZrO2/α-Al2O3 and YSZ/α-Al2O3 Interfaces

被引:4
作者
Xue, Yixuan [1 ]
Jiang, Jin-Wu [1 ]
机构
[1] Shanghai Univ, Sch Mech & Engn Sci, Shanghai Inst Appl Math & Mech, Shanghai Key Lab Mech Energy Engn, Shanghai 200072, Peoples R China
来源
ACTA MECHANICA SOLIDA SINICA | 2022年 / 35卷 / 01期
基金
中国国家自然科学基金;
关键词
Kapitza resistance; Compressive strain; Temperature; Size; YTTRIA-STABILIZED ZIRCONIA; THERMAL BARRIER COATINGS; MOLECULAR-DYNAMICS; CONDUCTIVITY; CONDUCTANCE; SPALLATION; PHOSPHORENE; MECHANISMS; SAPPHIRE; HELIUM;
D O I
10.1007/s10338-021-00266-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The Kapitza resistance is of fundamental importance for the thermal stability of the interface between the ceramic top coat and the thermal growth oxide layer in the thermal barrier coating structure, which is widely used to protect high-temperature components in current gas turbine engines. The top coat typically consists of the ZrO2 partially stabilized by 8% Y2O3 (YSZ), and the main component of the thermal growth oxide is alpha-Al2O3. In this work, the Kapitza resistance is found to be a small value of 0.69 m(2).K/GW for the YSZ/alpha-Al2O3 interface based on the heat dissipation simulation method. It indicates that the localization of thermal energy is rather weak, which is beneficial for the thermal stability of the YSZ/alpha-Al2O3 interface. This Kapitza resistance can be further reduced to 0.50 m(2) . K/GW by a mechanical or thermal compressive strain of 8%. To explore the underlying mechanism for this strain effect, we analyze the phonon vibration and the microscopic deformation in the interface region. It is revealed that the interface becomes denser through the compression-induced twisting of some Al-OZr and Al-OAl chemical bonds in the interface region, which is responsible for the reduction in the Kapitza resistance. The temperature effect and crystal size effect on the Kapitza resistance of the YSZ/alpha-Al2O3 interface are also systematically studied. These findings shall provide valuable information for further understanding of the thermal conductivity and thermal stability of the thermal barrier coating structures.
引用
收藏
页码:101 / 112
页数:12
相关论文
共 52 条
[1]   MOLECULAR-DYNAMICS WITH COUPLING TO AN EXTERNAL BATH [J].
BERENDSEN, HJC ;
POSTMA, JPM ;
VANGUNSTEREN, WF ;
DINOLA, A ;
HAAK, JR .
JOURNAL OF CHEMICAL PHYSICS, 1984, 81 (08) :3684-3690
[3]   LOWER LIMIT TO THE THERMAL-CONDUCTIVITY OF DISORDERED CRYSTALS [J].
CAHILL, DG ;
WATSON, SK ;
POHL, RO .
PHYSICAL REVIEW B, 1992, 46 (10) :6131-6140
[4]   HETEROEPITAXY OF CUBIC ZIRCONIA ON BASAL AND PRISMATIC PLANES OF SAPPHIRE [J].
CAIN, MG ;
LANGE, FF .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (03) :674-687
[5]  
Chen L., 2017, AIP ADV, V7
[6]   YBA2CU3O7 THIN-FILMS GROWN ON SAPPHIRE WITH EPITAXIAL YTTRIA-STABILIZED ZIRCONIA BUFFER LAYERS [J].
CHEN, LF ;
CHEN, PF ;
LI, L ;
LI, SL ;
JING, XN ;
PAN, SJ ;
GUO, YH .
APPLIED PHYSICS LETTERS, 1992, 61 (20) :2412-2413
[7]   Interfacial thermal conductance in graphene/black phosphorus heterogeneous structures [J].
Chen, Yang ;
Zhang, Yingyan ;
Cai, Kun ;
Jiang, Jinwu ;
Zheng, Jin-Cheng ;
Zhao, Junhua ;
Wei, Ning .
CARBON, 2017, 117 :399-410
[8]   Thermal/residual stress in an electron beam physical vapor deposited thermal barrier coating system [J].
Cheng, J ;
Jordan, EH ;
Barber, B ;
Gell, M .
ACTA MATERIALIA, 1998, 46 (16) :5839-5850
[9]   First-principles characterization of a heteroceramic interface:: ZrO2(001) deposited on an α-Al2O3(1(1)over-bar02) substrate [J].
Christensen, A ;
Carter, EA .
PHYSICAL REVIEW B, 2000, 62 (24) :16968-16983
[10]   First-principles study of the surfaces of zirconia [J].
Christensen, A ;
Carter, EA .
PHYSICAL REVIEW B, 1998, 58 (12) :8050-8064