Nanopatterning of self-assembled monolayers on Si-surfaces with AFM lithography

被引:18
作者
Lee, WB [1 ]
Oh, Y [1 ]
Kim, ER [1 ]
Lee, H [1 ]
机构
[1] Hanyang Univ, Dept Chem, Seoul 133791, South Korea
关键词
1,12-diaminododecane; n-tridecylamine; self assembly; atomic force microscopy; nano-lithography; anodization;
D O I
10.1016/S0379-6779(00)00392-1
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Ammonium chloride-modified monolayer was prepared on negatively charged Si-wafer surfaces with 1,12-diaminododecane (DAD). 2HCl by self assembly method and methyl modified monolayer was prepared with n-tridecylamine (TDA). HCl. The nano-pattems of these monolayers at the various anodization conditions demonstrated that the anodic reaction on DAD . 2HCl monolayer has an enhancement effect to generate the protruding lines. The film thickness measurements suggest that DAD . 2HCl monolayer was assembled completely on negatively charged Si-wafer surface in 1 mM of DAD . 2HCl aqueous solution after 5 min. The completely assembled monolayer generated discrete and uniform protruding lines by atomic force microscopy (AFM) anodization. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:305 / 306
页数:2
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