An intensity/linewidth analysis of opacity: first applications to a solar prominence and He II line profiles

被引：8
作者：
Kastner, SO [1 ]
Bhatia, AK [1 ]
机构：
[1] NASA, Goddard Space Flight Ctr, Astron & Solar Phys Lab, Greenbelt, MD 20771 USA
来源：
MONTHLY NOTICES OF THE ROYAL ASTRONOMICAL SOCIETY | 1998年 / 298卷 / 03期
关键词：
line; profiles; Sun; atmosphere; prominences; ultraviolet; stars;
D O I：
10.1046/j.1365-8711.1998.01694.x
中图分类号：
P1 [天文学];
学科分类号：
0704 ;
摘要：
An analysis is described which can derive optical thicknesses and associated quantities from measured intensities and linewidths using convenient expressions for photon escape probabilities and for opacity-broadened line halfwidths. An associated analysis of the effect of observational errors is provided. The analysis treats intensities and linewidths independently so that internal consistency of results can provide a measure of observational accuracy, which is shown here to be a stringent requirement. As examples, first applications are made to Si II lines in a solar prominence and to some high-resolution observations of the solar Hen 303.78-Angstrom resonance line.
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页码：763 / 776
页数：14
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